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Specific field emission properties of thin palladium films

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Abstract

The field emission current from thin palladium films deposited on insulating tips in UHV was measured as a function of film thickness at relatively low field strengths. The observed periodic oscillations of the field emission current can be interpreted as the quantum size effect.

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Stark, D., Zwicknagl, P. Specific field emission properties of thin palladium films. Appl. Phys. 10, 265–268 (1976). https://doi.org/10.1007/BF00897226

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PACS Codes

  • 79.40
  • 73