Applied physics

, Volume 13, Issue 3, pp 245–253 | Cite as

Structure investigations on single-crystal gold films

  • W. Fischer
  • H. Geiger
  • P. Rudolf
  • P. Wissmann
Contributed Papers
Received:
Accepted:

Abstract

Structure of epitaxially grown gold films of varying thickness (10–1000Å) has been investigated using LEED, AES, resistivity measurements and X-ray diffraction analysis. Silicon 111-oriented crystals, which are prehandled to exhibit\(\sqrt 3 \times \sqrt 3 R 30^\circ \)-supersctructure in the LEED pattern, serve as substrates. The gold films show a homogeneous structure with smooth surfaces and a marked (111)-orientation. The use of silicon substrates, however, is complicated by the fact, that silicon diffuses through the gold films to a small extent even at room temperature.

PACS code

68.50 
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Copyright information

© Springer-Verlag 1977

Authors and Affiliations

  • W. Fischer
    • 1
  • H. Geiger
    • 1
  • P. Rudolf
    • 1
  • P. Wissmann
    • 1
  1. 1.Institut für Physikalische und Theoretische ChemieUniversität Erlangen-NürnbergErlangenFed. Rep. Germany

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