High-speed tomographic spectrometry of a plasma
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Abstract
An example is presented of a method for simultaneously measuring the spatial and spectral characteristics of radiation in the diagnostics of a pulsed plasma.
Keywords
Radiation Statistical Physic Spectral Characteristic Pulse Plasma
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Literature Cited
- 1.M. I. Pergament, The Physics and Application of Plasma Accelerators [in Russian], Minsk (1974), pp. 261–288.Google Scholar
- 2.T. S. Mel'nikova and V. V. Pikalov, Izv. Siberian Otd. Akad. Nauk, Ser. Tekh Nauk,11, No. 3, 60–68 (1987).Google Scholar
- 3.N. G. Kolesnikvo, L. T. Lar'kina, and V. S. Éngel'sht, “Graphical method for making the Abel transformation.” Deposition in the All-Union Institute of Scientific and Technical Information (VINITI), No. 313-75. Izv. Akad. Nauk. Kirgiz. (1975).Google Scholar
- 4.K. Bockasten, J. Opt. Soc. Am.,51, No. 9, 943–947 (1961).Google Scholar
- 5.Yu. I. Chutov and V. A. Zhovtyanskii, Prib. Tekh. Éksp., No. 4, 225–226 (1977).Google Scholar
- 6.B. Cheminat, R. Gadaud, and P. Andanson, J. Phys. D: Appl. Phys.,20, No. 4, 444–452 (1987).Google Scholar
- 7.M. Hino, T. Aono, M. Nakajima, and S. Yuta, Appl. Opt.,25, No. 22, 4742–4746 (1987).Google Scholar
- 8.A. T. Ramsey and S. L. Turner, Rev. Sci. Instrum.,58, No. 7, 1211–1220 (1987).Google Scholar
- 9.Iokosha, Sasaki, Kawasima, et al., Prib. Nauch. Issled., No. 10, 93–96, (1988).Google Scholar
- 10.O. V. Filonin and G. B. Olelnikova, Prib. Tekh Éksp., No. 2, 230 (1989).Google Scholar
- 11.F. P. Press, Video Signal Shapers Based on Charge-Coupling Devices [Russian translation], Moscow (1981).Google Scholar
- 12.V. M. Efimov, A. M. Iskol'dskii, and Yu. E. Nesterikhin, Electron-Optical Photography in a Physical Experiment [in Russian], Novosibirsk (1978).Google Scholar
- 13.S. M. Slobodyan and T. N. Kitenko, Zarubezhnaya Radioélektronika, No. 7, 27–38 (1985).Google Scholar
- 14.A. N. Veklich and V. A. Zhovtyanskii, Zh. Prikl. Spektrosk.,50, No. 4, 565–570 (1989).Google Scholar
- 15.L. I. Andreeva, V. A. Zhovtyanskii, S. A. Kaidalov, et al., Photoelectronic Instruments for Investigating High-Speed Processes [in Russian], Moscow (1979), pp. 97–108.Google Scholar
- 16.A. Ya. Smirnov and G. G. Men'shikov, Scanning Instruments [in Russian], Leningrad (1986).Google Scholar
- 17.V. P. Ivannikov, Élektron. Promyshlennost', No. 10 (178), 53–54 (1988).Google Scholar
- 18.P. M. Epperson, J. V. Sweedler, M. B. Denton, et al., Opt. Eng.,26, No. 8, 715–723 (1987).Google Scholar
- 19.S. C. H. Wang, C. Y. Wei, H. H. Woodbury, et al., IEEE Trans. Electron Devices,32, 1599–1607 (1985).Google Scholar
- 20.G. D. Bakhtiarov, V. V. Malinin, and V. V. Shkolin, Analog-Digital Converters [in Russian], Moscow (1980).Google Scholar
- 21.F. P. Press, Electronics [in Russian], (Summaries of Science and Technology, VINITI)., Moscow (1986), Vol. 18, 38–88.Google Scholar
- 22.B. Rodericks, R. Clark, R. Smider, and A. Fontaine, Prib. Nauchn. Issled., No. 8, 11–16 (1989).Google Scholar
- 23.G. I. Aponin, A. A. Besshaposhnikov, and D. M. Kulakov, Prib. Tekh Éksp., No. 3, 173–174 (1986).Google Scholar
- 24.M. M. Blouke, D. L. Heidtmann, B. Corrle, and M. L. Lust, Proc. Soc. Photo-Opt. Instrum. Eng.,570, 82–88 (1985).Google Scholar
- 25.I. A. Bez'yazynchnyi, E. F. Lifshits, A. K. Berezin, et al., Plasma Diagnostics [in Russian], Moscow (1973), No. 2, pp. 59–63.Google Scholar
- 26.L. I. Andreeva, V. S. Dobrolyubov, V. A. Zhovtyanskii, et al., Prib. Tekh. Éksp., No. 5, 267 (1979).Google Scholar
- 27.L. I. Andreeva, A. N. Veklich, A. P. Gulyi, et al., Prib. Tekh Éksp., No. 1, 241 (1987).Google Scholar
- 28.V. A. Zhovtyanskii, “Experimental investigation of a pulsed expanding plasma,” Dissertation for Candidate of Physical-Mathematical Sciences, Kiev (1985).Google Scholar
- 29.V. A. Zhovtyanskii, K. V. Nelep, and O. M. Novik, Zh. Prikl. Spektrosk,49, No. 3, 400–407 (1988).Google Scholar
- 30.V. A. Zhovtyanskii and O. M. Novik, Zh. Tekh. Fiz.,59, No. 9, 186–189 (1989).Google Scholar
- 31.I. L. Babich, A. N. Veklich, and V. A. Zhovtyanskii, Zh. Prikl. Spektrosk.,51, No. 4, 571–575 (1989).Google Scholar
- 32.R. F. Harber and G. E. Sonnek, Appl. Opt.,5, No. 6, 1039–1043 (1966).Google Scholar
- 33.E. N. Eberhardt and R. J. Hertel, Appl. Opt.,10, No. 8, 1972–1974 (1971).Google Scholar
- 34.P. G. Weber, Rev. Sci. Instrum.,54, No. 10, 1331–1333 (1983).Google Scholar
- 35.P. Lindblom, S. Engman, A. Danielson, and E. Soderman, Phys. Ser.,22, No. 1, 61–67 (1980).Google Scholar
- 36.A. Danielson and L. Lindblom, Appl. Spectrosc.,30, No. 2, 151–155 (1976).Google Scholar
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© Plenum Publishing Corporation 1992