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Simulation used in metrological support

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Literature cited

  1. 1.

    É. I. Tsvetkov, Izmer. Tekh., No. 9, 25 (1983).

  2. 2.

    E. I. Tzwetkov (Tsvetkov), Measurement,1, No. 3, 129.

  3. 3.

    All-Union State Standard (GOST) 8.009-72: The State System of Measurements: Standardized Metrological Characteristics of Means of Measurement [in Russian].

  4. 4.

    Yu. A. Zhelnov, Accuracy Characteristics of Control Computers [in Russian], Énergoatomizdat, Moscow (1983).

  5. 5.

    M. I. Pavlovich, E. B. Solov'eva, and V. S. Sobolev, in: Proceedings of the All- Union Symposium on Statistical Measurements [in Russian], Vol. 1, VNIIEP, Leningrad (1982), p. 50.

  6. 6.

    A. A. Pankrishkin et al., in: Abstracts for the Third All-Union Symposium on Dynamic Measurements [in Russian], VNIIM, Leningrad (1981), p. 138.

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Translated from Izmeritel'naya Tekhnika, No. 7, pp. 9–10, July, 1985.

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Tsvetkov, É.I. Simulation used in metrological support. Meas Tech 28, 580–583 (1985). https://doi.org/10.1007/BF00862149

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Keywords

  • Physical Chemistry
  • Analytical Chemistry
  • Metrological Support