Advertisement

Applied Physics B

, Volume 38, Issue 2, pp 107–116 | Cite as

Determination of the nonlinear optical susceptibility χ(2) of surface layers by sum and difference frequency generation in reflection and transmission

  • B. Dick
  • A. Gierulski
  • G. Marowsky
  • G. A. Reider
Contributed Papers

Abstract

The theoretical investigation of sum and difference frequency generation in thin surface layers with rotational symmetry leads to formulas which connect the generated light intensities to the surface second order nonlinear susceptibility tensor. A maximum of seven tensor components can be determined in the case of lowest symmetry. Measurements in transmission should be especially useful since they allow easy variation of both polarization and angle of incidence. On the other hand, large signal enhancements are expected for total internal reflection geometries. A consistent set of χ(2) tensor components for a thin layer of rhodamine-6G adsorbed on fused silica is found based on data from reflection and transmission measurements.

PACS

42.65 Cq 41 

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    N. Bloembergen, P.S. Pershan: Phys. Rev.128, 606 (1962)Google Scholar
  2. 2.
    J. Ducuing, N. Bloembergen: Phys. Rev. Lett.10, 474 (1963)Google Scholar
  3. 3.
    R.K. Chang, N. Bloembergen: Phys. Rev.144, 775 (1966)Google Scholar
  4. 4.
    G.S. Agarwal, S.S. Jha: Solid State Commun.41, 499 (1982)Google Scholar
  5. 5.
    N. Bloembergen, R.K. Chang, C.H. Lee: Phys. Rev. Lett.16, 986 (1966)Google Scholar
  6. 6.
    C.H. Lee, R.K. Chang, N. Bloembergen: Phys. Rev. Lett.18, 167 (1967)Google Scholar
  7. 7.
    C.C. Wang, A.N. Duminski: Phys. Rev. Lett.20, 668 (1968)Google Scholar
  8. 8.
    F. Brown, R.E. Parks: Phys. Rev. Lett.16, 507 (1966)Google Scholar
  9. 9.
    F. Brown, M. Matsuoka: Phys. Rev.185, 985 (1969)Google Scholar
  10. 10.
    T.F. Heinz, C.K. Chen, D. Ricard, Y.R. Shen: Chem. Phys. Lett.83, 180 (1981)Google Scholar
  11. 11.
    C.K. Chen, T.F. Heinz, D. Ricard, Y.R. Shen: Chem. Phys. Lett.83, 455 (1981)Google Scholar
  12. 12.
    C.K. Chen, A.R.B. de Castro, Y.R. Shen: Phys. Rev. Lett.46, 145 (1981)Google Scholar
  13. 13.
    C.K. Chen, T.F. Heinz, D. Ricard, Y.R. Chen: Phys. Rev. Lett.46, 1010 (1981)Google Scholar
  14. 14.
    T.F. Heinz, C.K. Chen, D. Ricard, Y.R. Shen: Phys. Rev. Lett.48, 478 (1982)Google Scholar
  15. 15.
    T.F. Heinz, H.W.K. Tom, Y.R. Shen: Phys. Rev. A28, 1883 (1983)Google Scholar
  16. 16.
    C.K. Chen, T.F. Heinz, D. Ricard, Y.R. Shen: Phys. Rev. B27, 1965 (1983)Google Scholar
  17. 17.
    A. Penzkofer: Private communicationGoogle Scholar

Copyright information

© Springer-Verlag 1985

Authors and Affiliations

  • B. Dick
    • 1
  • A. Gierulski
    • 1
  • G. Marowsky
    • 1
  • G. A. Reider
    • 2
  1. 1.Abt. LaserphysikMax-Planck-Institut für Biophysikalische ChemieGöttingenFed. Rep. Germany
  2. 2.Institut für Allgemeine Elektrotechnik und Elektronik, Abteilung für Quantenelektronik und LasertechnikTechnische Universität WienWienAustria

Personalised recommendations