Advertisement

Oxidation of Metals

, Volume 30, Issue 3–4, pp 259–266 | Cite as

The importance of interfacial chemistry in protective oxide scale adherence

  • J. G. Smeggil
  • N. S. Bornstein
  • M. A. DeCrescente
Comments on a Paper

Abstract

The results of studies involving both alumina and chromia formers have demonstrated that segregation of low levels of indigenous impurity elements commonly found in metals and alloys can segregate to the scale-metal interface. Such segregation markedly affects protective-oxide-scale adherence to produce scale exfoliation. The most important element to cause exfoliation effects is sulfur, which is not uncommonly present in metals and alloys to levels of ∼50 ppm. The reduction of such sulfur to the 1–2 ppm range strongly increases oxide scale adherence without requiring additions of “active” elements, such as yttrium. The results of experiments that led to this conclusion are reiterated.

Key words

oxidation adhesion growth mechanisms sulfur impurities segregation 

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    A. W. Funkenbusch, J. G. Smeggil, and N. S. Bornstein,Metall. Trans. A 16A, 1164 (1985).Google Scholar
  2. 2.
    J. G. Smeggil, A. W. Funkenbusch, and N. S. Bornstein,Metall. Trans. A 17A, 923 (1986).Google Scholar
  3. 3.
    K. L. Luthra and C. L. Briant,Oxid. Met. 26, 397 (1986).Google Scholar
  4. 4.
    J. G. Smeggil and G. G. Peterson,Oxid. Met. 29, 103 (1988).Google Scholar
  5. 5.
    C. L. White, J. H. Schneibel, and R. A. Padgett,Metall. Trans. A 14A, 595 (1983).Google Scholar
  6. 6.
    H. Chaung, J. G. Lumsden, and R. A. Stahle,Metall. Trans. 10, 1853 (1974).Google Scholar
  7. 7.
    R. A. Mulford,Metall. Trans. A 14A, 865 (1983).Google Scholar
  8. 8.
    J. E. Doherty, A. F. Giamei, and B. H. Kear,Can. Met. A. 13, 229 (1974).Google Scholar
  9. 9.
    J. G. Smeggil,Mat. Sci. Eng. 87, 261 (1986).Google Scholar
  10. 10.
    D. G. Lees,Oxid. Met. 27, 75 (1987).Google Scholar
  11. 11.
    J. G. Smeggil,J. Electrochem. Soc. submitted for publication (1988).Google Scholar
  12. 12.
    J. L. Smialek,Metall. Trans. A 18A, 164 (1987).Google Scholar
  13. 13.
    J. G. Smeggil, E. L. Paradis, A. J. Shuskus, and N. S. Bornstein,J. Vac. Sci. Tech. A 3, 2569 (1985).Google Scholar
  14. 14.
    J. G. Smeggil and A. J. Shuskus,J. Vac. Sci. Technol. A 4, 2577 (1986).Google Scholar
  15. 15.
    J. G. Smeggil and A. J. Shuskus,Surface and Coatings Technol. 32, 57 (1987).Google Scholar

Copyright information

© Plenum Publishing Corporation 1988

Authors and Affiliations

  • J. G. Smeggil
    • 1
  • N. S. Bornstein
    • 1
  • M. A. DeCrescente
    • 1
  1. 1.United Technologies Research CenterE. Hartford

Personalised recommendations