Oxidation of Metals

, Volume 26, Issue 3–4, pp 287–303 | Cite as

Formation of elemental silicon inclusions in the sulfide scale on Cu-Si alloys

  • T. Werber
  • Z. Żurek
Article
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Abstract

The sulfidation of Cu-Si alloys in liquid sulfur resulted in an enrichment in the metallic substrate in silicon with the simultaneous formation of the η″ phase, whereas within the inner layer of the scale elementary silicon occurred in a dispersed form. The formation of the η″ phase in the surface layer of the metallic substrate results from the supersaturation of vacancies generated at the alloy/scale interface. The formation of silicon inclusions results in the selective sulfidation of copper when the η″ phase moves toward the inner layer of the scale.

Keywords

Cu-Si sulfidation intermetallic phase silicon-particle formation vacancies 
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Copyright information

© Plenum Publishing Corporation 1986

Authors and Affiliations

  • T. Werber
    • 1
  • Z. Żurek
    • 2
  1. 1.Department of Materials EngineeringTechnion-Israel Institute of TechnologyHaifaIsrael
  2. 2.Institute of Inorganic Chemistry and TechnologyTechnical University of CracowCracowPoland

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