Journal of Low Temperature Physics

, Volume 15, Issue 5–6, pp 523–536 | Cite as

Phonon reflection at a cleaved sodium fluoride-helium film interface

  • A. R. Long
  • R. A. Sherlock
  • A. F. G. Wyatt


High-frequency phonons (hω/kB≳10 K) have been reflected on the solid side of a sodium fluoride-helium-4 interface. The reflectivity was measured as a function of helium film thickness and it was found that most of the change occurs below a pressure of 0.1 of the SVP at ∼1.1 K, when the helium film is a few atomic layers thick. The largest change in reflectivity occurs for transverse phonons, which travel along longer paths than the specularly reflected phonons. It is suggested that the incident phonons excite surface modes which desorb some of the surface bound helium atoms.


Sodium Reflection Helium Film Thickness Magnetic Material 
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Copyright information

© Plenum Publishing Corporation 1974

Authors and Affiliations

  • A. R. Long
    • 1
  • R. A. Sherlock
    • 1
  • A. F. G. Wyatt
    • 1
  1. 1.Department of PhysicsUniversity of NottinghamNottinghamEngland

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