Journal of Materials Science Letters

, Volume 12, Issue 10, pp 721–723

The refractive index of InP and its oxide measured by multiple-angle incident ellipsometry

  • Tien Sheng Chao
  • Chung Len Lee
  • Tan Fu Lei
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Copyright information

© Chapman & Hall 1993

Authors and Affiliations

  • Tien Sheng Chao
    • 1
  • Chung Len Lee
    • 1
  • Tan Fu Lei
    • 1
  1. 1.Department of Electronics and Engineering and Institute of ElectronicsNational Chiao Tung UniversityHsinchuTaiwan

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