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Applied Physics A

, Volume 48, Issue 6, pp 509–515 | Cite as

Model calculations of diffusion limited trapping dynamics in quantum well laser structures

  • A. Weller
  • P. Thomas
  • J. Feldmann
  • G. Peter
  • E. O. Göbel
Solids and Materials

Abstract

We present a phenomenological theoretical model to treat the trapping of carriers into quantum wells of semiconductor laser structures. We consider explicitely the transport within the barrier layers by solving the continuity equation with the appropriate boundary conditions taking into account surface recombination, radiative and nonradiative recombination in the barrier layers and trapping of carriers into the quantum wells. The experimental findings for the trapping dynamics in GaAs/AlGaAs quantum well structures can be consistently interpreted by the model calculations.

PACS

73.20.Dx 78.55.Cr 78.47.+p 

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References

  1. 1.
    H. Shichijo, R.M. Kolbas, N. Holonyak Jr., R.D. Dupuis, P.D. Dapkus: Solid State Commun.27, 1029 (1978)Google Scholar
  2. 2.
    E.O. Göbel, H. Jung, J. Kuhl, K. Ploog: Phys. Rev. Lett.51, 1588 (1983)Google Scholar
  3. 3.
    J. Christen, D. Bimberg, A. Steckenborn, G. Weimann: Appl. Phys. Lett44, 84 (1984)Google Scholar
  4. 4.
    E.O. Göbel, R. Höger, J. Kuhl: InSemiconductor Quantum Well Structures and Superlattices VI, ed. by K. Ploog, N.T. Link, Les Editions de Physique, Les Ulis (1985) p. 53Google Scholar
  5. 5.
    T. Miyoshi, Y. Aoyagi, Y. Segawa, M. Nunashita: Jpn. J. Appl. Phys.24, L53 (1985)Google Scholar
  6. 6.
    J. Feldmann, G. Peter, E.O. Göbel, K. Leo, H.-J. Polland, K. Ploog, K. Fujiwara, T. Nakayama: Appl. Phys. Lett.51, 226 (1987)Google Scholar
  7. 7.
    H.-J. Polland, K. Leo, K. Ploog, J. Feldmann, G. Peter, E.O. Göbel, K. Fujiwara, T. Nakayama: Solid State Electron.31, 341 (1988)Google Scholar
  8. 8.
    H.-J. Polland, K. Leo, K. Rother, K. Ploog, J. Feldmann, G. Peter, E.O. Göbel, K. Fujiwara, T. Nakayama, Y. Ohta: Phys. Rev. B38, 7635 (1988)Google Scholar
  9. 9.
    J. Feldman, A. Weller, G. Peter, E.O. Göbel, P. Thomas: Proceedings of the ICPS, Warsaw 1988Google Scholar
  10. 10.
    B. Deveaud, J. Shah, T.C. Damen, W.T. Tsang: Appl. Phys. Lett.52, 1886 (1988)Google Scholar
  11. 11.
    J.Y. Tang, K. Hess, N. Holonyak, J.J. Coleman, P.D. Dapkus: J. Appl. Phys.53, 6043 (1982)Google Scholar
  12. 12.
    M. Babiker, B.K. Ridley: Superl. Microstr.2, 287 (1986)Google Scholar
  13. 13.
    J.A. Brum, G. Bastard: Phys. Rev. B33, 1420 (1986)Google Scholar
  14. 14.
    J.A. Brum, T. Weil, J. Nagle, B. Vinter: Phys. Rev. B34, 2381 (1986)Google Scholar
  15. 15.
    Y. Murayama: Phys. Rev. B34, 2500 (1986)Google Scholar
  16. 16.
    M. Babiker, M.P. Chamberlain, B.K. Ridley: Semicon. Sci. Tech.2, 582 (1987)Google Scholar
  17. 17.
    J.H. Wilkinson:The Algebraic Eigenvalue Problem (Clarendon, Oxford 1965)Google Scholar

Copyright information

© Springer-Verlag 1989

Authors and Affiliations

  • A. Weller
    • 1
  • P. Thomas
    • 1
  • J. Feldmann
    • 1
  • G. Peter
    • 1
  • E. O. Göbel
    • 1
  1. 1.Fachbereich PhysikPhilipps UniversitätMarburgFed. Rep. Germany

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