An analytical method for precise determination of lattice constants of cubic crystals, from x-ray diffractometric measurements, was formulated. The method minimizes both systematic and random errors and enables the estimation of the uncertainties in the constants. For higher precision, a weighting factor may also be used.
The method was applied to diffractometric data from a Si powder standard reference material and was considered to be highly reliable for precise measurements.
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Razik, N.A. Precise lattice constants determination of cubic crystals from x-ray powder diffractometric measurements. Appl. Phys. A 37, 187–189 (1985). https://doi.org/10.1007/BF00617505