Springer Nature is making SARS-CoV-2 and COVID-19 research free. View research | View latest news | Sign up for updates

Accuracy of determining the optical constants of semiconductors from their infrared transmittance

  • 17 Accesses

  • 1 Citations


The accuracy of determining the optical constants of semiconductors in the infrared range on the basis of absolute and relative transmittances of layers of varions thicknesses is analyzed graphically. The analysis showed that measurement of absolute transmittances for thickness ratios not smaller than three yields sufficiently accurate absorptance and reflectance values. Measurement of relative transmittances with allowance for multiple reflection is a highly accurate means of determining absorptance but is useless for determining reflectance. The curves appearing in the paper make possible practical error estimates for various specimen thickness ratios and surface reflectances.

This is a preview of subscription content, log in to check access.


  1. 1.

    A.P. Prishivalko, Trudy Instituta fiziki i matematiki AN BSSR: no. 3,176, 9, 1959.

  2. 2.

    F. Oswald, Optik,16, 9, 527, 1959.

  3. 3.

    M. P. Lisitsa, DAN SSSR,111, 4, 203, 1956.

  4. 4.

    K.D. Tovstyuk and O.M. Borets, Ukr. fiz. zhurnal,7, 12, 1285, 1962.

  5. 5.

    A.N. Bortrs and S.I. Grineva, Opt. i spektr,18, 825, 1965.

  6. 6.

    O.M. Borets and I.M. Stakhira, Ukr. fiz. zhurnal,9, 10, 1074, 1964.

Download references

Rights and permissions

Reprints and Permissions

About this article

Cite this article

Borets, A.N., Gertovich, T.S. Accuracy of determining the optical constants of semiconductors from their infrared transmittance. J Appl Spectrosc 4, 384–386 (1966). https://doi.org/10.1007/BF00617418

Download citation


  • Reflection
  • Analytical Chemistry
  • Molecular Structure
  • Error Estimate
  • Optical Constant