Preparation and imaging of macro-bicrystals in thin films
Surfaces, Interfaces, and Layer Structures
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Abstract
A recently proposed technique for preparing, in a very simple way, thin film tilt grain boundaries is described and analyzed. Some electron microscopy characterization of the bicrystals is presented and a comparison between this new method and some of the standard techniques is made from a critical point of view. Some new applications of grain boundary research using this technique are also proposed.
PACS
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© Springer-Verlag 1988