The use of SIMS to investigate the incorporation of oxygen in CoO scales
- 46 Downloads
SIMS was used to locate O18 in a thick oxide scale grown on a cobalt specimen oxidized first in O16 and subsequently in O18. Analyses were performed in depth profile from the oxide-gas interface and in step scan across a polished cross section. SIMS was found to be well suited to this type of oxygen tracer study. Eighty percent of the O18 was located in the inner quarter of the scale with a maximum value of 70% 10–15 μ from the metal-oxide interface. The distribution of the remaining O18 was essentially uniform in the outer 3/4 of the scale at an average value of 4.6%. There was, however, a layer 150 nm thick highly enriched in O18 at the oxide-gas interface. The O18 in the outer 3/4 of the porous scale is probably the result of normal exchange processes. The form of the distribution near the metal-oxide interface cannot be explained at this time.
Key wordsSIMS oxygen distribution CoO scales O18 exchange
Unable to display preview. Download preview PDF.
- 1.G. Amsel and D. Samuel,Anal. Chem. 39, 1689 (1967).Google Scholar
- 2.H. J. de Bruin, D. H. Bradhurst, and D. G. Walker, Paper presented at Symposium on Properties of Materials at High Temperatures, CSIRO N. Ryde, New South Wales, 21 August, 1967.Google Scholar
- 3.D. J. Derry, D. G. Lees, and J. M. Calvert,Proc. B. Ceram. Soc. 19, 77 (1971).Google Scholar
- 4.B. Cox and J. P. Pemsler,J. Nucl. Mater. 28, 73 (1968).Google Scholar
- 5.J. B. Holt,Proc. B. Ceram. Soc. 9, 157 (1967).Google Scholar
- 6.D. Caplan, M. J. Graham, and M. Cohen,J. Electrochem. Soc. 119, 1205 (1972).Google Scholar
- 7.G. B. Gibbs and R. Hales,Corros. Sci. 17, 487 (1977).Google Scholar
- 8.P. Kofstad,High Temperature Oxidation of Metals (John Wiley & Sons, New York, 1966).Google Scholar