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Stress relaxation in CdHgTe/CdTe heterostructures

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Abstract

Based on our analysis of the results of measurements of elastic deformation in CdxHg1−xTe/CdTe heterostructures it is shown that the degree of relaxation of the crystal lattice for Cd0.2Hg0.8Te films 1 µm thick with a working temperature of 273 K is 0.8766, which supports the idea of almost full relaxation of the mismatch stress for such thicknesses of A2B6 films.

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Additional information

Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 8, pp. 112–114, August, 1995.

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Areshkin, A.G., Vasil'eva, L.I., Litvinova, N.N. et al. Stress relaxation in CdHgTe/CdTe heterostructures. Russ Phys J 38, 863–864 (1995). https://doi.org/10.1007/BF00559293

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Keywords

  • Crystal Lattice
  • Stress Relaxation
  • Elastic Deformation
  • Full Relaxation
  • Mismatch Stress