Advertisement

Journal of Materials Science

, Volume 20, Issue 9, pp 3305–3310 | Cite as

A comparison of conductive and crystallographic effects of the phase transition in electrochemical nickel-boron layers

  • C. R. Pichard
  • Z. Bouhala
  • A. J. Tosser
  • A. Rashid
  • J. Flechon
Papers

Abstract

Experimental data related to the variations with temperature in the film resistivity of amorphous nickel-boron layers (electrochemically deposited) and its temperature coefficient are used for identifying the temperature for the phase transition. Suggestions are presented for interpreting the observed shifts in the resistivity and in the product of resistivity and its temperature coefficient.

Keywords

Temperature Coefficient Ageing Temperature Amorphous Layer Ni2B Film Resistivity 

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    C. R. Tellier and A. J. Tosser, “Size Effects in Thin Films” (Elsevier, Amsterdam-New York, 1982) chap. 1.Google Scholar
  2. 2.
    C. R. Pichard, C. R. Tellier and A. J. Tosser, J. Mater. Sci. Lett. 1 (1982) 423.CrossRefGoogle Scholar
  3. 3.
    J. Flechon, PhD thesis, Nancy (1960).Google Scholar
  4. 4.
    F. Machizaud, PhD thesis, Nancy (1973).Google Scholar
  5. 5.
    F.-A. Kuhnast, PhD thesis, Nancy (1979).Google Scholar
  6. 6.
    G. Mbemba, 3rd cycle thesis, Nancy (1981).Google Scholar
  7. 7.
    A. Obaida, 3rd cycle thesis, Nancy (1983).Google Scholar
  8. 8.
    A. Rashid, 3rd cycle thesis, Nancy (1983).Google Scholar
  9. 9.
    A. J. Tosser, C. R. Pichard and H. Zantout, University of Nancy 1, Internal Research Reports Vol. 10 (1983) p. 1.Google Scholar
  10. 10.
    F.-A. Kuhnast, F. Machizaud, R. Vangelisti and J. Flechon, J. Microsc. Spectrosc. Electron. 4 (197) 553.Google Scholar
  11. 11.
    F. Machizaud, F.-A. Kuhnast, G. Mbemba and J. Flechon, Proceedings of 5th International Conference on The Physics of Non-Crystalline Solids, Montpellier, France, July 1982 (J. Physique 43 suppl. 12 (1982) 75).Google Scholar
  12. 12.
    C. R. Pichard, F. Machizaud, A. Es-Slassi, A. J. Tosser, Thin Solid Films 112 (1984) 289.CrossRefGoogle Scholar
  13. 13.
    F.-A. Kuhnast, F. Machizaud, R. Vangelisti and J. Flechon, J. Microsc. Spectrosc. Electron 5 (1980) 735.Google Scholar
  14. 14.
    K. L. Chopra, “Thin Film Phenomena” (McGraw-Hill, New York, 1969) chap. 6.Google Scholar
  15. 15.
    F.-A. Kuhnast, F. Machizaud, J. Flechon, C. R. Pichard and A. J. Tosser, Thin Solid Films 81 (1981) 181.CrossRefGoogle Scholar
  16. 16.
    N. F. Mott, Proc. Phys. Soc. 47 (1935) 571.CrossRefGoogle Scholar
  17. 17.
    Idem, Adv. in Phys. 13 (1964) 325.CrossRefGoogle Scholar
  18. 18.
    Idem, Phil. Mag. 26 (1978) 1249.CrossRefGoogle Scholar
  19. 19.
    R. Evans, B. L. Gyorffy, N. Szabo and J. M. Ziman, “The Properties of Liquid Metal” (Taylor and Francis, London, 1972) p. 319.Google Scholar
  20. 20.
    C. C. Bradley, T. E. Faber, E. G. Wilson and J. M. Ziman, Phil. Mag. 7 (1962) 865.CrossRefGoogle Scholar
  21. 21.
    J. M. Ziman, “Electrons and Phonons” (Clarendon, Oxford, 1960) chap. 7.Google Scholar
  22. 22.
    Proceedings of 4th International Conference on Liquid and Amorphous Metals, Grenoble, France, 1980 (J. Physique 41 (1980) C8).Google Scholar
  23. 23.
    F.-A. Kuhnast, F. Machizaud and J. Flechon, J. Physique 41 (1980) C8–250.Google Scholar
  24. 24.
    J. Bletry, Rev. Phys. Appl. 15 (1980) 1019.CrossRefGoogle Scholar
  25. 25.
    F. Machizaud, F.-A. Kuhnast and J. Flechon, J. Non-Cryst. Solids in press.Google Scholar
  26. 26.
    I. V. Abarenkov and V. Heine, Phil. Mag. 12 (1965) 529.CrossRefGoogle Scholar
  27. 27.
    J. Dousson, PhD thesis, Université de Nancy 1 (1979).Google Scholar
  28. 28.
    J.-C. Mathieu, F. Durand and E. Bonnier, J. Chim. Phys. 62 (1965) 88.Google Scholar
  29. 29.
    Idem, ibid. 62 (1065) 1297.CrossRefGoogle Scholar
  30. 30.
    P. Hicter, F. Bonnier, ibid, 68 (1971) 804.CrossRefGoogle Scholar
  31. 31.
    Idem, ibid. 68 (1971) 809.CrossRefGoogle Scholar
  32. 32.
    E. A. Guggenheim, “Mixtures” (Clarendon, Oxford, 1952) Chap. 2.Google Scholar
  33. 33.
    A. J. Tosser, C. R. Pichard, H. Zantout, M. Bedda and J. Flechon, Proceeding of 3rd IASTED International Symposium, MIC '84, Innsbruck, 1984 (Acta Press) Commun. 63–154.Google Scholar
  34. 34.
    F. Machizaud, F.-A. Kuhnast, J. Flechon, B. Auguin and A. Dufresne, J. Physique 42 (1981) 97.CrossRefGoogle Scholar
  35. 35.
    P. Lagarde, J. Rivory and G. Vlaic, J. Non-Cryst. solids 57 (1983) 275.CrossRefGoogle Scholar

Copyright information

© Chapman and Hall Ltd 1985

Authors and Affiliations

  • C. R. Pichard
    • 1
  • Z. Bouhala
    • 1
  • A. J. Tosser
    • 1
  • A. Rashid
    • 1
  • J. Flechon
    • 1
    • 2
  1. 1.Laboratoire d'ElectroniqueUniversité de Nancy 1Vandoeuvre-les-Nancy CedexFrance
  2. 2.Laboratoire de Physique des Depots MetalliquesUniversité de Nancy 1Vandoeuvre-les-Nancy CedexFrance

Personalised recommendations