Journal of Materials Science

, Volume 20, Issue 9, pp 3253–3259 | Cite as

Investigation of surface activity and photoinduced diffusion of metals in solution deposited amorphous films of As2S3

  • K. Solomon Harshavardhan
  • K. N. Krishna
  • K. J. Rao


Surface activity of solution deposited (SD) amorphous films of As2S3 has been investigated. Silver and copper are readily deposited on such films from appropriate aqueous ionic solutions. The metals diffuse into the films upon irradiation with energetic photons. Structure and properties of SD films have been investigated using electron microscopy, optical spectroscopy and differential scanning calorimetry. The amorphous films tend to crystallize upon metal diffusion. The stability of amorphous films, the deposition of metals on their active surfaces and the photo-induced diffusion may all be attributed to the presence or production of charged defects in amorphous chalcogenide films.


Ag2S Chalcogenide Glass Silver Atom Amorphous Film Charged Defect 


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  1. 1.
    J. P. DeNeufville, “Optical Properties of Solids — Recent Developments” (North-Holland, Amsterdam, 1975) p. 439.Google Scholar
  2. 2.
    I. Shimizu and H. Fritzshe, J. Appl. Phys. 47 (1976) 2969.CrossRefGoogle Scholar
  3. 3.
    K. Tanaka and Y. Ohtsuka, Thin Solid Films 48 (1978) 17.CrossRefGoogle Scholar
  4. 4.
    Idem, J. Appl. Phys. 49 (1978) 6132.CrossRefGoogle Scholar
  5. 5.
    J. P. DeNeufville, S. C. Moss and S. R. Ovshinsky, J. Non-Cryst. Solids 13 (1974) 191.CrossRefGoogle Scholar
  6. 6.
    K. Tanaka, Appl. Phys. Lett. 26 (1975) 243.CrossRefGoogle Scholar
  7. 7.
    S. Rajagopalan, Bhanwar Singh, P. K. Bhat, D. K. Pandya and K. L. Chopra, J. Appl. Phys. 50 (1977) 489.CrossRefGoogle Scholar
  8. 8.
    Y. Utsugi and S. Zembutsu, Appl. Phys. Lett. 27 (1975) 508.CrossRefGoogle Scholar
  9. 9.
    M. S. Chang and T. W. Hon, Opt. Commun. 24 (1978) 220.CrossRefGoogle Scholar
  10. 10.
    M. S. Chang and J. T. Chen, Appl. Phys. Lett. 33 (1978) 892.CrossRefGoogle Scholar
  11. 11.
    M. Kasai, H. Nakatsui and Y. Hazimoto, J. Appl. Phys. 45 (1974) 3209.CrossRefGoogle Scholar
  12. 12.
    B. T. Kolomiets, S. S. Lantratova, V. M. Lyubin, V. P. Pukh and M. A. Tagirdzhanov, Sov. Phys. Solid State 18 (1976) 686.Google Scholar
  13. 13.
    K. L. Chopra, K. Solomon Harshavardhan, S. Rajagopalan and L. K. Malhotra, Solid State Commun. 40 (1981) 387.CrossRefGoogle Scholar
  14. 14.
    Idem, Appl. Phys. Lett. 40 (1982) 428.CrossRefGoogle Scholar
  15. 15.
    K. Solomon Harshavardhan, S. Rajagopalan, L. K. Malhotra and K. L. Chopra, J. Appl. Phys. 54 (1983) 1048.CrossRefGoogle Scholar
  16. 16.
    A. Matusuda and M. Kikuchi, J. Jpn. Soc. Appl. Phys. 42 (1973) 239.Google Scholar
  17. 17.
    H. Mizuno, K. Tanaka and M. Kikuchi, Solid State Commun. 12 (1973) 999.CrossRefGoogle Scholar
  18. 18.
    G. C. Chern and I. Lauks, J. Appl. Phys. 53 (1982) 6979.CrossRefGoogle Scholar
  19. 19.
    A. Yosikawa, O. Ochi, H. Nagai and Y. Mizushima, Appl. Phys. Lett. 29 (1976) 677.CrossRefGoogle Scholar
  20. 20.
    L. A. Freeman, R. F. Shaw and A. D. Yofee, Thin Solid Films 3 (1969) 367.CrossRefGoogle Scholar

Copyright information

© Chapman and Hall Ltd 1985

Authors and Affiliations

  • K. Solomon Harshavardhan
    • 1
  • K. N. Krishna
    • 1
  • K. J. Rao
    • 1
    • 2
  1. 1.Materials Research LaboratoryIndian Institute of ScienceBangaloreIndia
  2. 2.SSCU, Indian Institute of ScienceIndia

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