Applied Physics A

, Volume 52, Issue 5, pp 299–301 | Cite as

Mapping the fermi surface of graphite with a display-type photoelectron spectrometer

  • A. Santoni
  • L. J. Terminello
  • F. J. Himpsel
  • T Takahashi
Solids And Materials

Abstract

A display spectrometer is used to image the momentum distribution of photoelectrons from the Fermi level in graphite. The Fermi “surface” consists of six points at the corners K of the hexagonal, two-dimensional Brillouin zone, in agreement with band theory. The method is also applied to other equal energy surfaces below the Fermi level, thereby giving the band dispersion of the π-bands.

PACS

79.60.Cn 71.25.Pi 71.25.Hc 

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    S.G. Kevan: Physica Scripta T31, 32 (1990)Google Scholar
  2. 2.
    E.W. Plummer, W. Eberhardt: Adv. Chem. Phys. 49, 533 (1982)Google Scholar
  3. 3.
    F.J. Himpsel: Adv. Phys. 32, 1 (1985)Google Scholar
  4. 4.
    D.E. Eastman, J.J. Donelon, N.C. Hien, F.J. Himpsel: Nucl. Instrum. Methods 172, 327 (1980)Google Scholar
  5. 5.
    L.J. Terminello et al.: To be publishedGoogle Scholar
  6. 6.
    P.M. Williams: Il Nuovo Cimento 38, 216 (1977)Google Scholar
  7. 7.
    W. Eberhardt, I.T. McGovern, E.W. Plummer, J.E. Fisher: Phys. Rev. Lett. 44, 200 (1980)Google Scholar
  8. 7.
    I.T. McGovern, W. Eberhardt, E.W. Plummer, J.E. Fischer: Physica 99, 415 (1980)Google Scholar
  9. 8.
    A.R. Law, J.J. Barry, H.P. Hughes: Phys. Rev. B 28, 5332 (1983)Google Scholar
  10. 9.
    D Marchand, C. Frétigny, M. Laguës, F. Batallan, Ch. Simon, I. Rosenman, R. Pinchaux: Phys. Rev. B 30, 4788 (1984)Google Scholar
  11. 10.
    R.F. Willis, B. Feuerbacher, B. Fitton: Phys. Rev. B 4, 2441 (1971)Google Scholar
  12. 11.
    R.F. Willis, B. Fitton, G.S. Painter: Phys. Rev. B 9, 1926 (1974)Google Scholar
  13. 12.
    T. Takahashi, H. Tokailin, T. Sagawa: Phys. Rev. B 32, 8317 (1985)Google Scholar
  14. 13.
    Th. Fauster, F.J. Himpsel, J.E. Fischer, E.W. Plummer: Phys. Rev. Lett. 51, 430 (1983)Google Scholar
  15. 14.
    H. Ohsawa, T. Takahashi, T. Kinoshita, Y. Enta, H. Ishii, T. Sagawa: Solid State Commun. 61, 347 (1987)Google Scholar
  16. 15.
    L. Schäfer, M. Schlüter, M. Skibowski: Phys. Rev. B 35, 7663 (1987)Google Scholar
  17. 16.
    F. Maeda, T. Takahashi, H. Ohsawa, S. Suzuki: Phys. Rev. B 37, 4482 (1988)Google Scholar
  18. 17.
    R. Claessen, H. Carstensen, M. Skibowski: Phys. Rev. B 38, 12582 (1988)Google Scholar
  19. 18.
    I.R. Collins, P.T. Andrews, A.R. Law: Phys. Rev. B 38, 13348 (1988)Google Scholar
  20. 19.
    G.S. Painter, D.E. Ellis: Phys. Rev. B 1, 4747 (1970)Google Scholar
  21. 20.
    A. Zunger: Phys. Rev. B 17, 626 (1978)Google Scholar
  22. 21.
    C.P. Mallett: J. Phys. C 14, L213 (1981)Google Scholar
  23. 22.
    R.C. Tatar, N.A.W. Holzwarth, S. Rabii: Synthetic Metals 3, 131 (1981)Google Scholar
  24. 23.
    R.C. Tatar, S. Rabii: Phys. Rev. B 25, 4126 (1982)Google Scholar
  25. 24.
    N.A.W. Holzwarth, S.G. Louie, S. Rabii: Phys. Rev. B 26, 5382 (1982)Google Scholar
  26. 25.
    L.J. Terminello et al.: To be publishedGoogle Scholar

Copyright information

© Springer-Verlag 1991

Authors and Affiliations

  • A. Santoni
    • 1
  • L. J. Terminello
    • 1
  • F. J. Himpsel
    • 1
  • T Takahashi
    • 2
  1. 1.IBM Research DivisionThomas J. Watson Research CenterYorktown HeightsUSA
  2. 2.Department of PhysicsTohoku UniversitySendaiJapan

Personalised recommendations