Journal of Materials Science Letters

, Volume 15, Issue 3, pp 263–265

A study of the nonlinear absorption of Ge nanocrystallites embedded in SiO2 thin films by the Z-scan technique

  • L. -P. Yue
  • Y. -Z. He
Article

DOI: 10.1007/BF00274470

Cite this article as:
Yue, L.P. & He, Y.Z. J Mater Sci Lett (1996) 15: 263. doi:10.1007/BF00274470

Copyright information

© Chapman & Hall 1996

Authors and Affiliations

  • L. -P. Yue
    • 1
  • Y. -Z. He
    • 1
  1. 1.Institute of Solid State PhysicsAcademia SinicaHefeiPeople's Republic of China

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