Dislocation emission from moving cleavage cracks in silicon at room temperature
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Keywords
Polymer Silicon Material Processing Cleavage Crack Dislocation Emission
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References
- 1.A. George and G. Michot, in Proceedings of the International Conference on Fundamental Aspects of Dislocation Interactions, Ascona, 1992.Google Scholar
- 2.
- 3.
- 4.A. S. Argon, Acta Metall. 35 (1987) 185.Google Scholar
- 5.J. R. Rice, J. Mech. Phys. Solids 40 (1992) 239.Google Scholar
- 6.D. Katzer and E. Langer, VDI-Bericht 960/2, Proceedings, Gerätetechnik und Mikrosystemtechnik, Chemnitz, 1992, p. 579.Google Scholar
- 7.Y. Murakami, “Stress intensity factors handbook” (Pergamon Press, Oxford, 1990).Google Scholar
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© Chapman & Hall 1994