Interface Science

, Volume 1, Issue 1, pp 61–75 | Cite as

The chemical composition of a metal/ceramic interface on an atomic scale: The Cu/MgO {111} interface

  • H. Jang
  • D. N. Seidman
  • K. L. Merkle
Article
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Abstract

The chemical composition profile across a Cu/MgO {111}-type heterophase interface, produced by the internal oxidation of a Cu(Mg) single-phase alloy at 1173 K, is measured via atom-probe field-ion microscopy with a spatial resolution of 0.121 nm; this resolution is equal to the interplanar spacing of the {222} MgO planes. In particular, we demonstrate directly that the bonding across a Cu/MgO {111}-type heterophase interface, along a <111> direction common to both the Cu matrix and an MgO precipitate, has the sequence Cu|O|Mg... and not Cu|Mg|O...; this result is achieved without any deconvolution of the experimental data. Before determining this chemical sequence, it was established, via high-resolution electron microscopy, that the morphology of an MgO precipitate in a Cu matrix is an octahedron faceted on {111} planes with a cube-on-cube relationship between a precipitate and the matrix; that is, {111}Cu//{222}MgO and <110>Cu // <110>MgO.

Keywords

Metal/ceramic interface internal oxidation Cu/MgO heterophase interface high resolution electron microscopy atom-probe field-ion microscopy 
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Copyright information

© Kluwer Academic Publishers 1993

Authors and Affiliations

  • H. Jang
    • 1
    • 2
  • D. N. Seidman
    • 1
    • 2
  • K. L. Merkle
    • 3
  1. 1.Department of Materials Science and EngineeringNorthwestern UniversityEvanstonUSA
  2. 2.The Materials Research CenterRobert R. McCormick School of Engineering and Applied ScienceEvanstonUSA
  3. 3.Materials Science DivisionArgonne National LaboratoryArgonneUSA

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