Ring-like testing of digital circuits
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Abstract
Here we propose a new approach to the testing of digital devices, which can potentially save diagnostic hardware. An example is given for testing combinational devices. Estimates are given for reliability and hardware complexity, and an algorithm for designing operability tests is described.
Key words
built-in self-test design for testability signature testingPreview
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References
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Copyright information
© Kluwer Academic Publishers 1991