Abstract
Coherence properties available from the advanced X-ray synchrotrons and X-ray Free Electron Laser sources bring the opportunities to get new information of the dynamics and local structures non-destructively. Here we review recent progress of the coherent X-ray diffraction imaging technique for measuring internal strain distribution of the nanomaterial systems. We introduce the general coherence properties of the sources and show the fundamental principle and technical aspects of the technique. Some examples of the applications are shown for various nanostructures, grains in polycrystalline films, and semiconducting devices even with in situ and operando conditions. We discuss the future development of the technique in terms of the understanding and control of the strains, which are very crucial in nanomaterial design and applications.
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D. H. Bilderback, P. Elleaume and E. Weckert, J. Phys. B: At. Mol. Opt. Phys. 38, S773 (2005).
G. Grübel, A. Madsen and A. Robert, Soft-Matter Characterization: X-ray photon correlation spectroscopy (Springer-Verlag, 2008).
H. Kim et al., Phys. Rev. Lett. 90, 068302 (2003).
J. Miao et al., Nature 400, 342 (1999).
M. Pfeifer et al., Nature 442, 63 (2006).
S. Eisebitt et al., Nature 432, 885 (2004).
J. Carnis et al., Scientific Reports 4, 6017 (2014).
F. Lehmkühler et al., Scientific Reports 5, 17193 (2015).
M. M. Seibert et al., Nature 470, 78 (2011).
T. Gorkhover et al., Nat. Photonics 12, 150 (2018).
P. Emma et al., Nat. Photonics 4, 641 (2010).
C. Gutt et al., Phys. Rev. Lett. 108, 024801 (2012).
J. Carnis, Coherent X-ray scattering study of dynamics and nanostructures, Ph. D dissertation, College of Science, Sogang University, Seoul, Korea, 2015.
J. Als-Nielsen and D. McMorrow, Elements of modern X-ray physics (Wiley, 2011).
A. Singer et al., Phys. Rev. Lett. 101, 254801 (2008).
A. Singer et al., Optics Express 20, 17480 (2012).
I. A. Vartanyants et al., Phys. Rev. Lett. 107, 144801 (2011).
M. Sutton et al., Nature (London) 352, 608 (1991).
S. Lee et al., Optics Express 21, 24647 (2013).
S. Lee et al., Optics Express 20, 9790 (2012).
F. Lehmkühler et al., Scientific Reports 4, 5234 (2014).
K. Amane et al., Scientific Reports 8, 831 (2018).
K. Yun et al., (unpublished).
J. W. Goodman, Speckle Phenomena in Optics (Roberts and Company Publishers, 2007).
D. Sayre, Acta Cryst. 5, 843 (1952).
A. P. Mancuso and G. J. Williams, Nat. Photonics. 6, 574 (2012).
J. R. Fienup, Appl. Opt. 21, 2758 (1982).
W. Cha et al., New J. Phys. 12, 035022 (2010).
R. W. Gerchberg and W. O. Saxton, Optik 35, 237 (1972).
J. R. Fienup, Opt. Lett. 3, 27 (1978).
J. Miao et al., Phys. Rev. Lett. 89, 088303 (2002).
R. Bates, Optik 61, 247 (1982).
I. K. Robinson et al., Phys. Rev. Lett. 87, 195505 (2001).
G. J. Williams et al., Phys. Rev. Lett. 90, 175501 (2003).
I. K. Robinson and R. Harder, Nat. Mater. 8, 291 (2009).
W. Cha et al., Nat. Mater. 12, 729 (2013).
R. Harder et al., Phys. Rev. B 76, 115425 (2007).
H. N. Chapman et al., J. Opt. Soc. Am. A 23, 1179 (2006).
M. Watari et al., Nat. Mater. 10, 862 (2011).
M. C. Newton et al., Nat. Mater. 9, 120 (2010).
J. N. Clark et al., Nat. Commun. 3, 993 (2012).
V. Favre-Nicolin et al., New J. Phys. 12, 035013 (2010).
S. Labat et al., ACS Nano 9, 9210 (2015).
A. Davtyan et al., New J. Phys. 18, 063021 (2016).
A. Davtyan et al., J. Appl. Cryst. 50, 673 (2017).
A. A. Minkevich et al., Phys. Rev. B 76, 104106 (2007).
G. Xiong et al., Appl. Phys. Lett, 99, 114103 (2011).
G. Xiong et al., Adv. Mater. 26, 7747 (2014).
A. Ulvestad et al., Nano Lett. 15, 4066 (2015).
X. Huang et al., Nano Lett. 15, 7644 (2015).
N. Vaxelaire et al., Acta Materialia 78, 46 (2014).
A. Yau et al., Science 356, 739 (2017).
A. Yau et al., ACS Nano 11, 10945 (2017).
A. Ulvestad et al., Nat. Commun. 6, 10092 (2015).
A. Ulvestad et al., Nat. Mat. 16, 565 (2017).
D. Kim et al., Nat. Commun. 9, 3422 (2018).
W. Cha et al., Adv. Funct. Mater. 27, 1700331 (2017).
Y. K. Chen-Wiegart et al., Nanoscale 9, 5686 (2017).
A. Ulvestad et al., Nano Lett. 14, 5123 (2014).
A. Ulvestad et al., Phys. Chem. Chem. Phys. 17, 10551 (2015).
A. Ulvestad et al., Science 348, 1344 (2015).
J. N. Clark et al., Science 341, 56 (2013).
G. V. Hartland, J. Chem. Phys. 116, 8048 (2002).
K. Ichiyanagi et al., Phys. Rev. B 84, 024110 (2011).
J. N. Clark et al., PNAS 112, 7444 (2015).
M. J. Cherukara et al., Nano Lett. 17, 1102 (2017).
M. J. Cherukara et al., Nano Lett. 17, 7696 (2017).
A. Ulvestad et al., Scientific Reports 7, 9823 (2017).
Acknowledgments
This research was supported by the National Research Foundation of Korea (NRF-2014R1A2A1A10052454 2015R1A5A1009962, 2016R1A6B2A02005468, and 2017K1A3A7A09016379).
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Kim, D., Choi, S., Yun, K. et al. Nanoscale Strain Imaging using Coherent X-ray Light Sources. J. Korean Phys. Soc. 73, 793–804 (2018). https://doi.org/10.3938/jkps.73.793
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DOI: https://doi.org/10.3938/jkps.73.793