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Analyzing the fractal properties of a structure via microscopic images

  • Proceedings of the XXV Russian Conference on Electron Microscopy (RCEM-2014)
  • Published:
Bulletin of the Russian Academy of Sciences: Physics Aims and scope

Abstract

Space-frequency filtering and filters based on Fourier images of Gaussian and Morlet wavelets are used to synthesize microstructure images with fractal properties. Ways of analyzing the local fractal properties of structures, based on evaluating the fractal dimension in a small sliding window, are proposed and studied.

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Authors and Affiliations

  1. Far Eastern Federal University, Vladivostok, 690950, Russia

    B. N. Grudin, K. A. Petrov, V. S. Plotnikov, S. V. Polishchuk & E. B. Modin

Authors
  1. B. N. Grudin
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  2. K. A. Petrov
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  3. V. S. Plotnikov
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  4. S. V. Polishchuk
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  5. E. B. Modin
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Corresponding author

Correspondence to B. N. Grudin.

Additional information

Original Russian Text © B.N. Grudin, K.A. Petrov, V.S. Plotnikov, S.V. Polishchuk, E.B. Modin, 2015, published in Izvestiya Rossiiskoi Akademii Nauk. Seriya Fizicheskaya, 2015, Vol. 79, No. 11, pp. 1528–1532.

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Grudin, B.N., Petrov, K.A., Plotnikov, V.S. et al. Analyzing the fractal properties of a structure via microscopic images. Bull. Russ. Acad. Sci. Phys. 79, 1345–1349 (2015). https://doi.org/10.3103/S1062873815110088

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  • DOI: https://doi.org/10.3103/S1062873815110088

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