Abstract
It is established that for nonconstant Boolean function f(x 1, …, x n ), there is a testable generalized iterative switching circuit in which function f(x 1, …, x n ) is realized and the single fault detection test of constant length is assumed.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
S. V. Yablonskii and I. A. Chegis, “On tests for electric circuits,” Usp. Mat. Nauk 10 (4), 182–184 (1955).
I. A. Chegis and S. V. Yablonskii, “Logical methods for control of electric circuits,” Tr. Mat. Inst. im. V. A. Steklova, Akad. Nauk SSSR 51, 270–360 (1958).
N. P. Red’kin, Reliability and Diagnostics of Circuits (Mosk. Gos. Univ., Moscow, 1992) [in Russian].
S. A. Lozhkin, Lectures on the Fundamentals of Cybernetics (VMiK Mosk. Gos. Univ., Moscow, 2004) [in Russian].
S. A. Lozhkin and A. V. Kondratov, “High-accuracy asymptothic estimates for the complexity of implementation of function systems with iterative contact circuits,” in Applied Mathematics and Information Technology, (MAKS Press, Moscow, 2005), No. 21, pp. 102–110 [in Russian].
Kh. A. Madatyan, “A complete test for nonrepeating contact circuits,” in Problems of Cybernetics (Nauka, Moscow, 1970), No. 23, pp. 103–118 [in Russian].
Kh. A. Madatyan, “Construction of individual tests for contact circuits,” in Collected Works on Mathematical Cybernetics (Vychisl. Tsentr Akad. Nauk SSSR, Moscow, 1981), pp. 77–86 [in Russian].
N. P. Red’kin, “On complete checking tests for contact circuits,” in Methods for Discrete Analysis in the Study of Extremal Structures (IM SO AN SSSR, Novosibirsk, 1983), No. 39, pp. 80–87 [in Russian].
N. P. Red’kin, “On checking tests for closing and opening,” in Methods for Discrete Analysis in Optimisation of Control Systems (IM SO AN SSSR, Novosibirsk, 1983), No. 40, pp. 87–99 [in Russian].
A. I. Rybko, “On contact circuits correcting closures and permitting control,” in Mathematical Problems of Cybernetics, No. 1 (Nauka, Moscow, 1988), pp. 168–190 [in Russian].
D. S. Romanov, “On the synthesis of contact circuits permitting short checking tests,” Uch. Zap. Kazan. Univ., Ser. Fiz.-Mat. Nauki 156 (3), 110–115 (2014).
Author information
Authors and Affiliations
Additional information
Original Russian Text © D.S. Romanov, E.Yu. Romanova, 2015, published in Vestnik Moskovskogo Universiteta. Vychislitel’naya Matematika i Kibernetika, 2015, No. 3, pp. 42–50.
About this article
Cite this article
Romanov, D.S., Romanova, E.Y. Single fault detection tests for generalized iterative switching circuits. MoscowUniv.Comput.Math.Cybern. 39, 144–152 (2015). https://doi.org/10.3103/S0278641915030073
Received:
Published:
Issue Date:
DOI: https://doi.org/10.3103/S0278641915030073