Abstract
In recent years, an innovative twin-wire plasma arc additive manufacturing (TW-PAAM) process is conducted to the in situ alloying of TiAl alloys. As a newly invented method of TiAl alloy fabrication, the microcrack defect is a great concern. In the present research, two binary TiAl alloys containing different microcrack tendencies, Ti-45Al and Ti-48Al, are fabricated using the TW-PAAM method. To locate possible defects in the as-fabricated alloys, the non-destructive testing X-ray computed tomography is performed. According to the results, under the same TW-PAAM parameter set, microcracks are initiated throughout Ti-45Al while Ti-48Al stays integrated. Also, more α2-Ti3Al are generated in grain boundaries of Ti-45Al than Ti-48Al, thus lead to higher local misorientations and the intergranular microcracks. The clarification of the Al content-induced microcrack generation provides clear improvement direction of the innovative additive manufacturing technique.
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Acknowledgments
The authors gratefully acknowledge financial support from Science and Technology Commission of Shanghai Municipality (STCSM, Funding No. 19511106400, “Sailing Program” No. 19YF1422700), and National Natural Science Foundation of China (NSFC, Funding No. 51901136).
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The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.
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Shen, C., Hua, X., Li, F. et al. Composition-induced microcrack defect formation in the twin-wire plasma arc additive manufacturing of binary TiAl alloy: An X-ray computed tomography-based investigation. Journal of Materials Research 36, 4974–4985 (2021). https://doi.org/10.1557/s43578-021-00412-1
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DOI: https://doi.org/10.1557/s43578-021-00412-1