Abstract
A novel strain-rate jump method was developed for the plane-strain bulge test and used to investigate the time-dependent deformation behavior of gold thin films in the thickness range 100–400 nm. The experimental method is based on an abrupt variation of the pressurization rate. The evaluated strain-rate sensitivity was found to be five times higher for films in freestanding condition (m = 0.094) than for films tested on a SiNx substrate (m = 0.020). Bulge creep tests confirmed this increased time-dependence. The observation of the surface of the freestanding films after the creep tests provided evidence of apparent grain boundary sliding taking place next to intragranular plastic deformation. The out-of-plane deformation was presumably favored by the columnar microstructure of the samples, with grains extending between both free surfaces. In the case of SiNx-supported films, grain boundary sliding was prevented by the good adhesion of gold to the SiNx substrate.
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ACKNOWLEDGMENTS
The authors would like to thank Peter Pokrowsky from the Hochschule Kaiserslautern in Zweibrücken for providing access to the reactive ion etching facility used to make the gold membranes freestanding. They would also like to thank Petra Rosner from the group of Erdmann Spiecker at the University of Erlangen-Nürnberg for assistance with the evaporation device and Verena Maier from the Austrian Science Academy in Leoben for performing nanoindentation experiments. The authors also gratefully acknowledge the funding of the German Research Council (DFG), which, within the framework of its “Excellence Initiative”, supports the cluster of excellence “Engineering of Advanced Materials” at the University of Erlangen-Nürnberg.
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Merle, B., Cassel, D. & Göken, M. Time-dependent deformation behavior of freestanding and SiNx-supported gold thin films investigated by bulge tests. Journal of Materials Research 30, 2161–2169 (2015). https://doi.org/10.1557/jmr.2015.184
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DOI: https://doi.org/10.1557/jmr.2015.184