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Preparation and parametric analysis of film/substrate band-gap systems based on elastic instability

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Abstract

Film/substrate systems with periodic surface morphology generated by elastic instability can have important applications in elastic wave control, as proved by previous finite element analysis. However, experimental verification remains a challenge because of the limited magnitude and adjustment of patterns wavelength, the interface debonding and the structure warpage. A novel experimental method in which film and substrate are selected homologues, and two-phase moisture curing process is adopted to control the physical state of the substrate, the surface pattern and the residual mismatch stress was firstly proposed to prepare the bilayer structures without the detachment and the warpage. Vibration test showed that propagation of the elastic waves could be suppressed in the fabricated bilayer system. Through modelling the formation of surface patterns and the propagation of elastic waves, finite element simulation and dimensional analysis were carried out to examine the band-gap performance of various bilayer structures. Numerical results show that the wavelength of surface patterns which depends on four processing parameters, i.e., the instability load, the film thickness and the elastic moduli of the film and the substrate after the first curing, is crucial to the band-gap properties of film/substrate systems. An analytical expression is given to approximately estimate the surface patterns wavelength and a design guide is suggested to manufacture the film/substrate system considering the film limiting conditions in practice.

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Data Availability Statement

This manuscript has associated data in a data repository. [Authors’comment: Data will be made available on reasonable request.]

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Acknowledgements

The authors would like to thank the support from the National Natural Science Foundation of China (Grant Nos. 11872324 and 11902229).

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Authors and Affiliations

  1. Key Laboratory of Testing Technology for Manufacturing Process, Ministry of Education, Southwest University of Science and Technology, Mianyang, 621010, China

    Jia-Ming Deng, Yi Ren, Huan Lv, Hai-Dong Liu & Bin Gu

  2. Wuhan Second Ship Design and Research Institute, Wuhan, 430064, China

    Man-Gong Zhang, Zhao Li & Zhi-Gao Zhao

  3. Department of Astronautical Science and Mechanics, Harbin Institute of Technology, Harbin, 150001, China

    Fei Jia

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  1. Jia-Ming Deng
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  2. Man-Gong Zhang
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  3. Zhao Li
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  4. Zhi-Gao Zhao
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Correspondence to Hai-Dong Liu, Fei Jia or Bin Gu.

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Deng, JM., Zhang, MG., Li, Z. et al. Preparation and parametric analysis of film/substrate band-gap systems based on elastic instability. Eur. Phys. J. Plus 137, 686 (2022). https://doi.org/10.1140/epjp/s13360-022-02908-z

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