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Two-dimensional atom localization by absorption spectrum using superposition of two super-Gaussian beams

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Abstract

Atom microscopy is controlled and modified by absorption spectrum of a weak probe field using the superposition of two super-Gaussian beams. Circular and elliptical localization peaks are investigated with variance, power and direction of the super-Gaussian beams. The shape of localization peaks depends upon the variance of the standard deviation and power of the super-Gaussian beams. Depth elliptical localization peaks are also controlled and modified with direction and variance of super-Gaussian beams. The modified results show significance in advanced nano-lithography and high technological applications.

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Acknowledgements

The author (A. Dahshan) extends his appreciation to the Deanship of Scientific Research at King Khalid University for funding this work through Large Groups Project under Grant Number (RGP.2/141/43).

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Authors and Affiliations

  1. Lab of Theoretical Physics, Department of Physics, Hazara University, Mansehra, 21300, Pakistan

    Akhtar Zaman, Muhammad Haneef & Humayun Khan

  2. Department of Physics, University of Malakand, Chakdara Dir(L), Pakistan

    B. A. Bacha

  3. Department of Physics, Faculty of Science, King Khalid University, P.O. Box 9004, Abha, Saudi Arabia

    A. Dahshan

  4. Department of Physics, Faculty of Science, Port Said University, Port Said, Egypt

    A. Dahshan

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  1. Akhtar Zaman
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  2. Muhammad Haneef
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  4. B. A. Bacha
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  5. A. Dahshan
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Correspondence to Muhammad Haneef.

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Zaman, A., Haneef, M., Khan, H. et al. Two-dimensional atom localization by absorption spectrum using superposition of two super-Gaussian beams. Eur. Phys. J. Plus 137, 616 (2022). https://doi.org/10.1140/epjp/s13360-022-02836-y

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