Abstract.
The structure for the powder of 3-formyl chromone was examined by X-ray diffraction technique in the \( 2\theta^{\circ}\) range ( \( 4^{\circ}\) - \( 60^{\circ}\) . The configuration of Al/3-formyl chromone/Al samples was designed. The electrical and dielectric properties were studied as a function of frequency (42- \( 5 \times 10^{6}\) Hz) and temperature (298-408K). The ac conductivity data of bulk of 3-formyl chromone varies as a power law with the frequency at different temperatures. The predominant mechanism for ac conduction was deduced. The ac conductivity shows a thermally activated process at different frequencies. The dielectric constant and dielectric loss were determined using the capacitance and dissipation factor measurements at different temperatures. The dielectric loss shows a peak of relaxation time that shifted to higher frequency with an increase in the temperature. The activation energy of the relaxation process was estimated.
Similar content being viewed by others
References
G. Malliaras, R. Friend, Phys. Today 58, 53 (2005)
S. Coe, W.K. Woo, M. Bawendi, V. Bulovic, Nature 420, 800 (2002)
L. Li, S.V. Winckel, J. Genoe, P. Heremans, Appl. Phys. Lett. 95, 153301 (2009)
L. Hu, D.S. Hecht, G. Grüner, Chem. Rev. 110, 5790 (2010)
Q. Cao, J.A. Rogers, Adv. Mater. 21, 29 (2009)
S.R. Forrest, M.E. Thompson, Chem. Rev. 107, 923 (2007)
B. de Boer, A. Facchetti, Polym. Rev. 48, 423 (2008)
B.W. D’Andrade, S.R. Forrest, Adv. Mater. 16, 1585 (2004)
G. Dennler, M.C. Scharber, C.J. Brabec, Adv. Mater. 21, 1323 (2009)
J.D. Myers, J. Xue, Polym. Rev. 52, 1 (2012)
Z.K. Liu, J. Li, Z. Sun, G. Tai, S.P. Lau, F. Yan, ACS Nano. 6, 810 (2012)
Q. Tai, J. Li, Z.K. Liu, Z.H. Sun, X.Z. Zhao, F. Yan, J. Mater. Chem. 21, 6848 (2011)
F. Yan, J.H. Li, S.M. Mok, J. Appl. Phys. 106, 074501 (2009)
B.S. Ong, Y. Wu, Y. Li, P. Liu, H. Pan, Chem. Eur. J. 14, 4766 (2008)
L. Wang, D. Fine, D. Sharma, L. Torsi, A. Dodabalapur, Anal. Bioanal. Chem. 384, 310 (2006)
T. Zhang, S. Mubeen, N.V. Myung, M.A. Deshusses, Nanotechnology 19, 332001 (2008)
A. Moliton, R.C. Hiorns, Polym. Int. 53, 1397 (2004)
C. Liao, F. Yan, Polym. Rev. 53, 352 (2013)
M. Kawase, T. Tanaka, H. Kan, S. Tani, H. Nakashima, H. Sakagami, In Vivo 21, 829 (2007)
Z.N. Siddiqui, F. Farooq, Chem. Sci. 124, 1097 (2012)
M.M. El-Nahass, H.A.M. Ali, M. Saadeldin, M. Zaghllol, Physica B 407, 4453 (2012)
M.M. El-Nahass, H.A.M. Ali, Solid State Commun. 152, 1084 (2012)
M. Edwards, P. Guggilla, A. Janen, J. Polius, S. Egarievwe, M. Curley, Am. J. Mater. Sci. 5, 1 (2015)
J. Rodriguez-Carvajal, FULLPROF 2000: A Rietveld Refinement and Pattern Matching Analysis Program (Version: April 2008) Laboratorie Leon Brillouin (CEA-CNRS) France (2008)
I.H. Khudayer, Int. J. Curr. Eng. Technol. 4, 495 (2014)
H.E. Atyia, N.A. Hegab, Optik 127, 6232 (2016)
A.K. Jonscher, Universal Relaxation Law (Chelsea Dielectrics Press, London, 1996)
A.K. Jonscher, Nature 267, 673 (1977)
A.K. Jonscher, J. Mater. Sci. 16, 2037 (1981)
T. Mathew, A.G. Kunjomana, K. Munirathnam, K.A. Chandrasekharan, M. Meena, C.K. Mahadevan, Cryst. Struct. Theor. Appl. 1, 79 (2012)
G.E. Pike, Phys. Rev. B 6, 1572 (1972)
E.M. El-Menyawy, H.M. Zeyada, M.M. El-Nahass, Solid State Sci. 12, 2182 (2010)
A.M. Nawar, H.M. Abd El-Khalek, M.M. El-Nahass, Org. Opto-Elect. 1, 25 (2015)
H.A.M. Ali, Eur. Phys. J. Plus 131, 57 (2016)
F. Yakuphanoglu, Y. Aydogdu, U. Schatzschneider, E. Rentschler, Solid State Commun. 128, 63 (2003)
I.M. Soliman, M.M. El-Nahass, Y. Mansour, Solid State Commun. 225, 17 (2016)
S. Hariech, M.S. Aida, H. Moualkia, Mater. Sci. Semicond. Process. 15, 181 (2012)
O.E. Sherif, Int. J. Electrochem. Sci. 10, 9751 (2015)
K. Pandey, M. Singh, N. Asthana, M.M. Dwivedi, S.L. Agrawal, Int. J. Mater. Sci. 1, 9 (2011)
S.M. Shaban, B.S. Mahdi, R.M.S. Al-Haddad, Ind. J. Pure Appl. Phys. 51, 784 (2013)
A.M. Saleh, S.M. Hraibat, R.M.-L. Kitaneh, M.M. Abu-Samreh, S.M. Musameh, J. Semicond. 33, 082002 (2012)
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Ali, H.A.M. Structural, ac conductivity and dielectric properties of 3-formyl chromone. Eur. Phys. J. Plus 132, 327 (2017). https://doi.org/10.1140/epjp/i2017-11595-4
Received:
Accepted:
Published:
DOI: https://doi.org/10.1140/epjp/i2017-11595-4