Abstract
The possibility of obtaining thick films (3 to 7 µm) of solid solution Pd–6 wt % Ru by magnetron sputtering of a target having the corresponding composition is shown. The structure, phase composition, and surface morphology of films condensed on the surface of oxidized silicon, fluorphlogopite, and anodic aluminum oxide at 300–950 K are studied. A general trend of formation of a gradient grain structure of thick films (with a high grain dispersity level at the initial growth stage) and subsequent selective growth of grains and subgrains having an anisotropic shape and primary orientation <111> is independent of the structure and morphology of the substrate surface.
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Original Russian Text © V.M. Ievlev, A.A. Maksimenko, E.K. Belonogov, S.V. Kannykin, B.V. Sladkopevtsev, G.S. Burkhanov, N.R. Roshan, E.M. Chistov, 2015, published in Materialovedenie, 2015, No. 2, pp. 37–40.
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Ievlev, V.M., Maksimenko, A.A., Belonogov, E.K. et al. Oriented crystallization of thick Pd–Ru films during magnetron sputtering of target. Inorg. Mater. Appl. Res. 6, 311–315 (2015). https://doi.org/10.1134/S2075113315040127
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DOI: https://doi.org/10.1134/S2075113315040127