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Dual band nano structured anti reflection thin film coatings

  • Nanoscale and Nanostructured Materials and Coatings
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Abstract

Dual band (3–5 μm and 8–12 μm) multilayer nano-structured antireflection thin films comprising alternate layers of ZrO2 and SiO2 were deposited on Silicon (100) substrate by RF magnetron sputtering. Peaks of both spectral windows were optimized during the design process to match the peak response of the sensor in the two spectra. The multilayer structure and morphology of the deposited films were analyzed by RBS, XRD, AFM and SEM. The transmission measurements showed an average transmission of T avg ~ 93% in 3–5 μm and T avg ~ 83% in 9–12 μm, making the structure effective in both spectral windows and useful in dual channel imaging applications.

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Authors and Affiliations

  1. Riphah International University, I—14, Islamabad, Pakistan

    Z. Iqbal, M. H. Asghar & A. ul Haq

  2. Experimental Physics Labs, National Centre for Physics, Islamabad, Pakistan

    M. Usman

  3. Federal Urdu University of Science and Technology, Islamabad, Pakistan

    A. Ismatullah & Nazir A. Naz

  4. National Center for Physics, QAU Campus, Islamabad, Pakistan

    I. Ahmed

Authors
  1. Z. Iqbal
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  2. M. H. Asghar
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  3. M. Usman
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  4. A. ul Haq
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  5. A. Ismatullah
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  6. Nazir A. Naz
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  7. I. Ahmed
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Correspondence to Z. Iqbal.

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Iqbal, Z., Asghar, M.H., Usman, M. et al. Dual band nano structured anti reflection thin film coatings. Prot Met Phys Chem Surf 52, 481–485 (2016). https://doi.org/10.1134/S2070205116030138

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  • DOI: https://doi.org/10.1134/S2070205116030138

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