Abstract
Multilayer structures based on semiconductor materials of the antimonide group with InSb and AlxIn1 – xSb absorbing layers, including structures with an InAlSb barrier layer (InSb/InAlSb/InSb), designed for the manufacturing of advanced photodetectors (PDs) that detect radiation in the mid-wave infrared (IR) range. On the basis of p–i–n and barrier structures grown by the MBE method, photosensitive elements (PSEs) of various topologies with InSb and AlxIn1 – xSb absorbing layers were fabricated. It is shown that wide-gap AlxIn1 – xSb ternary solutions, which detect radiation in the medium-wavelength region of the spectrum, are an alternative to the narrow-gap binary compound InSb, because, due to the wide-gap, photodiodes based on AlxIn1 – xSb have lower currents and, therefore, noise. The average values of detectivity D* and noise-equivalent temperature difference (NETD) have been measured for various topology photodetectors, so D* was more than 1011 cm W–1 Hz1/2 in p–i–n structures, and D* exceed of 1012 cm W–1 Hz1/2 in barrier structures.
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Boltar, K.O., Iakovleva, N.I., Lopukhin, A.A. et al. Photodetector Devices Based on p–i–n and Barrier Structures of the Mid-Wave IR Spectrum Range. J. Commun. Technol. Electron. 68, 316–324 (2023). https://doi.org/10.1134/S106422692303004X
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DOI: https://doi.org/10.1134/S106422692303004X