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Developing Low-Profile Deflectometer for Combined Scanning Probe and Optical Microscopy Systems

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Abstract

We have developed, manufactured, and tested a system of low-profile scanning probe microscopy (SPM) deflectometer capable of increasing the numerical aperture of objectives to a record high value of NA = 0.75. Implementation of this system will significantly improve performance characteristics of the optical microspectroscopy (OM) methods realized in combined SPM/OM systems.

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REFERENCES

  1. J. Caplan, M. Niethammer, R. M. Taylor II, and K. J. Czymmek, Curr. Opin. Struct. Biol. 21 (5), 686 (2011). https://doi.org/10.1016/j.sbi.2011.06.010

    Article  Google Scholar 

  2. T. L. Burnett and P. J. Withers, Nat. Mater. 18, 1041 (2019). https://doi.org/10.1038/s41563-019-0402-8

    Article  ADS  Google Scholar 

  3. B. Joosten, M. Willemse, J. Fransen, A. Cambi, and K. van den Dries, Front. Immunol. 9, 1908 (2018). https://doi.org/10.3389/fimmu.2018.01908

    Article  Google Scholar 

  4. L. Novotny and B. Hecht, Principles of Nano-Optics, 2nd ed. (Cambridge Univ. Press, Cambridge, 2012), p. 133.

    Book  Google Scholar 

  5. K. E. Mochalov, A. A. Chistyakov, D. O. Solovyeva, A. V. Mezin, V. A. Oleinikov, I. S. Vaskan, M. Molinari, I. I. Agapov, I. Nabiev, and A. E. Efimov, Ultramicroscopy 182, 118 (2017). https://doi.org/10.1016/j.ultramic.2017.06.022

    Article  Google Scholar 

  6. https://www.ntmdt-si.ru/products/afm-raman-nano-ir-systems/ntegra-spectra-ii.

  7. A. E. Efimov, I. I. Agapov, O. I. Agapova, V. A. Oleinikov, A. V. Mezin, M. Molinari, I. Nabiev, and K. E. Mochalov, Rev. Sci. Instrum. 88, 023701 (2017). https://doi.org/10.1063/1.4975202

    Article  ADS  Google Scholar 

  8. http://nanoscantech.com/ru/products/spm/spm-72.html.

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Funding

This work was supported in part by the Russian Science Foundation, project no. 18-19-00718.

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Authors and Affiliations

  1. Shemyakin-Ovchinnikov Institute of Bioorganic Chemistry of the Russian Academy of Sciences, 117997, Moscow, Russia

    A. V. Mezin, D. O. Solovyeva, I. S. Vaskan, V. A. Oleinikov & K. E. Mochalov

  2. Academician Shumakov National Medical Research Center for Transplantology and Artificial Organs, Ministry of Health of Russias, 123182, Moscow, Russia

    A. E. Efimov

  3. Moscow Institute of Physics and Technology (National Research University), 141701, Dolgoprudny, Moscow oblast, Russia

    I. S. Vaskan

Authors
  1. A. V. Mezin
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  2. A. E. Efimov
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  3. D. O. Solovyeva
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  4. I. S. Vaskan
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  5. V. A. Oleinikov
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  6. K. E. Mochalov
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Corresponding author

Correspondence to K. E. Mochalov.

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The authors declare that they have no conflict of interest.

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Translated by P. Pozdeev

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Mezin, A.V., Efimov, A.E., Solovyeva, D.O. et al. Developing Low-Profile Deflectometer for Combined Scanning Probe and Optical Microscopy Systems. Tech. Phys. Lett. 47, 287–289 (2021). https://doi.org/10.1134/S1063785021030238

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  • DOI: https://doi.org/10.1134/S1063785021030238

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