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Electrophysical Characteristics of Multilayer Memristive Nanostructures Based on Yttria-Stabilized Zirconia and Tantalum Oxide

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Abstract

The electrophysical characteristics of a multilayer memristive Au/Ta/ZrO2(Y)/TaOx/TiN structure have been studied. Electron and ion electret effects due to charge carrier trapping and ion migration polarization in the dielectric have been discovered. The influence of traps on electroforming processes and resistive switching has been established. The values of activation energy and ion and trap concentrations have been determined. The effect of resistive switching stabilization has been found, which is associated with the specific bilayer structure of TaOx and self-forming tantalum nanoclusters. The nanoclusters serve as electric field concentrators in the course of electroforming and subsequent resistive switching.

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Funding

This study was financially supported by the Russian Foundation for Basic Research, grant no. 18-29-23001.

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Authors and Affiliations

  1. Lobachevsky State University, 603950, Nizhny Novgorod, Russia

    S. V. Tikhov, A. I. Belov, D. S. Korolev, I. N. Antonov, A. A. Sushkov, D. A. Pavlov, D. I. Tetel’baum, O. N. Gorshkov & A. N. Mikhailov

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  1. S. V. Tikhov
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  2. A. I. Belov
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  3. D. S. Korolev
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  4. I. N. Antonov
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  5. A. A. Sushkov
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  6. D. A. Pavlov
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  7. D. I. Tetel’baum
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  8. O. N. Gorshkov
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  9. A. N. Mikhailov
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Correspondence to S. V. Tikhov.

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Translated by V. Isaakyan

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Tikhov, S.V., Belov, A.I., Korolev, D.S. et al. Electrophysical Characteristics of Multilayer Memristive Nanostructures Based on Yttria-Stabilized Zirconia and Tantalum Oxide. Tech. Phys. 65, 284–290 (2020). https://doi.org/10.1134/S1063784220020231

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  • DOI: https://doi.org/10.1134/S1063784220020231

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