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Spin-Wave Resonance in Chemically Deposited Fe-Ni Films: Measuring the Spin-Wave Stiffness and Surface Anisotropy Constant

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Abstract

Single-layer Fe x Ni1 - x thin magnetic films have been investigated by the spin-wave resonance technique in the entire concentration range. The surface anisotropy and exchange stiffness constants for the films with a Ni content from 30 to 80 at % have been measured from the experimental standing spin wave spectra. The surface exchange spin wave penetration depth δ C = 20–30 nm has been determined from the dependences of the surface anisotropy and exchange coupling constants on the Fe20Ni80 film thickness in the range of 250–400 nm.

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Authors and Affiliations

  1. Kirensky Institute of Physics, Siberian Branch, Russian Academy of Sciences, Krasnoyarsk, 660036, Russia

    I. G. Vazhenina, R. S. Iskhakov & L. A. Chekanova

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  1. I. G. Vazhenina
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  2. R. S. Iskhakov
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  3. L. A. Chekanova
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Correspondence to I. G. Vazhenina.

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Original Russian Text © I.G. Vazhenina, R.S. Iskhakov, L.A. Chekanova, 2018, published in Fizika Tverdogo Tela, 2018, Vol. 60, No. 2, pp. 287–293.

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Vazhenina, I.G., Iskhakov, R.S. & Chekanova, L.A. Spin-Wave Resonance in Chemically Deposited Fe-Ni Films: Measuring the Spin-Wave Stiffness and Surface Anisotropy Constant. Phys. Solid State 60, 292–298 (2018). https://doi.org/10.1134/S1063783418020294

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