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A Time-of-Flight Atomic Analyzer with 2D Electrostatic Focusing

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Abstract

A scheme of a multichannel time-of-flight atomic analyzer with an electrostatic deflection system that provides two-dimensional focusing of the ion beam in the transverse direction is described. A thin carbon film with a thickness of 100 Å is used to ionize the incoming flow of atoms. The results of numerical simulation of the main parameters of the analyzer, such as the energy values in the channels, their energy resolution, and permeability, are given. An example of the possible use of such an atomic analyzer for measuring the energy distribution function of thermal plasma ions and fast ions of heating beams in the deuterium–tritium operating regime of the TRT facility is considered. The efficiency of radiation background suppression in the analyzer detection system by the coincidence circuit has been analyzed.

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Funding

The study was supported by the Ministry of Education and Science of the Russian Federation within State assignment no. 0040-2019-0023.

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Authors and Affiliations

  1. Ioffe Institute, Russian Academy of Sciences, St. Petersburg, Russia

    V. I. Afanasyev, A. D. Melnik, M. I. Mironov, A. S. Navolotskii, V. G. Nesenevich, M. P. Petrov, S. Ya. Petrov & F. V. Chernyshev

  2. Peter the Great St. Petersburg Polytechic University, St. Petersburg, Russia

    S. S. Kozlovskii

Authors
  1. V. I. Afanasyev
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  2. S. S. Kozlovskii
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  3. A. D. Melnik
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  4. M. I. Mironov
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  5. A. S. Navolotskii
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  6. V. G. Nesenevich
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  7. M. P. Petrov
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  8. S. Ya. Petrov
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  9. F. V. Chernyshev
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Corresponding authors

Correspondence to V. I. Afanasyev or S. S. Kozlovskii.

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Translated by O. Kadkin

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Afanasyev, V.I., Kozlovskii, S.S., Melnik, A.D. et al. A Time-of-Flight Atomic Analyzer with 2D Electrostatic Focusing. Plasma Phys. Rep. 48, 829–837 (2022). https://doi.org/10.1134/S1063780X22700295

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  • DOI: https://doi.org/10.1134/S1063780X22700295

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