Abstract
Atom probe tomography (APT) is a tool for detailed chemical composition analysis of advanced structural material nanostructure. The use of different Atomic Probe Tomography (APT) devices requires a certification of these setups prior to conducting research. In this paper a method of comparing APT setups in order to evaluate the influence of the overall system configuration on the accuracy of obtained data is proposed. The collected data comparison is presented for the aluminum alloy Al–3.3Cu–2.5Mn–0.5Zr and structural steel 16Kh12МVSFBR gathered on the APPLE-3D (“PAZL-3D”) setup and on the new ATLAS (“ATLAZ”) unit, created through upgrading the ECOTAP. Comparison of the results confirms the feasibility of carrying out research of the same material on similar setups without significant distortion of the data under its analysis and interpretation.
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REFERENCES
T. Martin, A. London, B. Jenkins, S. Hopkin, J. Douglas, P. Styman, and M. Moody, Microsc. Microanal. 23, 227 (2017).
S. V. Rogozhkin, A. A. Aleev, A. A. Lukyanchuk, A. S. Shutov, O. A. Raznitsyn, and S. E. Kirillov, Instrum. Exp. Tech. 60, 428 (2017).
R. Schlesiger, C. Oberdorfer, R. Wuerz, G. Greiwe, P. Stender, M. Artmeier, P. Pelka, F. Spaleck, and G. Schmitz, Rev. Sci. Instrum. 81, 043703 (2010).
B. Gault, F. Vurpillot, A. Vella, M. Gilbert, A. Menand, D. Blavette, and B. Deconihout, Rev. Sci. Instrum. 77, 043705 (2006).
K. Hono, T. Ohkubo, Y. M. Chen, M. Kodzuka, K. Ohishi, H. Sepehri-Amin, F. Lia, T. Kinno, S. Tomiya, and Y. Kanitani, Ultramicroscopy 111, 576 (2011).
E. P. Silaeva, N. S. Shcheblanov, T. E. Itina, A. Vella, J. Houard, N. Sévelin-Radiguet, F. Vurpillot, and B. Deconihout, Appl. Phys. A 110, 703 (2013).
A. L. Suvorov, S. V. Rogozhkin, A. G. Zaluzhnyj, A. A. Aleev, V. F. Bobkov, S. V. Zajcev, A. V. Karpov, M. A. Kozodaev, B. A. Loginov, and O. N. Makeev, Vopr. At. Nauki Tekh., Ser.: Materialoved. Nov. Mater., No. 1 (66), 3 (2006).
S. V. Rogozhkin, A. A. Nikitin, A. A. Khomich, N. A. Iskandarov, V. V. Khoroshilov, A. A. Bogachev, A. A. Lukyanchuk, O. A. Raznitsyn, A. S. Shutov, P. A. Fedin, R. P. Kuibeda, T. V. Kulevoy, A. L. Vasiliev, M. Yu. Presniakov, K. S. Kravchuk, and A. S. Useinov, Phys. At. Nucl. 82 (9), 1239 (2019).
O. A. Raznitsyn, A. A. Lukyanchuk, A. S. Shutov, and S. V. Rogozhkin, J. Anal. Chem. 72, 1404 (2017).
O. A. Raznitsyn, A. A. Lukyanchuk, A. S. Shutov, S. V. Rogozhkin, and A. A. Aleev, Yad. Fiz. Inzhin. 8, 138 (2017).
S. V. Rogozhkin, A. A. Aleev, A. A. Lukyanchuk, A. S. Shutov, O. A. Raznitsyn, and S. E. Kirillov, Instrum. Exp. Tech. 60, 428 (2017).
A. A. Lukyanchuk, S. V. Rogozhkin, O. A. Raznitsyn, A. S. Shutov, and A. A. Aleev, Yad. Fiz. Inzhin. 8, 150 (2017).
A. S. Shutov, A. A. Lukyanchuk, S. V. Rogozhkin, O. A. Raznitsyn, N. A. Iskandarov, and A. A. Aleev, Yad. Fiz. Inzhin. 8, 141 (2017).
S. I. Porollo, A. M. Dvoriashin, Yu. V. Konobeev, and F. A. Garner, J. Nucl. Mater. 329–333, 314 (2004).
N. Belov, T. Akopyan, N. Korotkova, P. Shurkin, V. Timofeev, O. Raznitsyn, and T. Sviridova, J. Alloys Compd., 161948 (2021).
N. A. Belov, T. K. Akopyan, N. O. Korotkova, V. N. Timofeev, and P. K. Shurkin, Mater. Lett. 300, 130199 (2021).
F. Danoix, G. Grancher, A. Bostel, and D. Blavette, Ultramicroscopy 107, 734 (2007).
F. Danoix, G. Grancher, A. Bostel, and D. Blavette, Ultramicroscopy 107, 739 (2007).
F. Tang, B. Gault, S. P. Ringer, and J. M. Cairney, Ultramicroscopy 110, 836 (2010).
F. D. Geuser, B. Gault, A. Bostel, and F. Vurpillot, Surf. Sci. 601, 536 (2007).
P. Bas, A. Bostel, B. Deconihout, and D. Blavette, Appl. Surf. Sci. 87–88, 298 (1995).
A. S. Shutov, A. A. Lukyanchuk, S. V. Rogozhkin, O. A. Raznitsyn A. A. Nikitin, A. A. Aleev, and C. E. Kirillov, Phys. At. Nucl. 82, 1292 (2019).
O. Hellman, J. Vandenbroucke, J. Rusing, D. Isheim, and D. Seidman, Microsc. Microanal 6, 437 (2000).
J. M. Hyde and C. A. English, MRS Proc. 650, R6.6 (2000).
ACKNOWLEDGMENTS
Atom probe tomography was performed on the equipment of the KAMIKS resource center (http://kamiks. itep.ru/) of NRC “Kurchatov Institute” —ITEP.
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Lukyanchuk, A.A., Raznitsyn, O.A., Shutov, A.S. et al. Influence of Type and Configuration of the Atom Probe Tomography Setup with Laser Evaporation on the Data Reconstruction Accuracy. Phys. Atom. Nuclei 84, 2004–2009 (2021). https://doi.org/10.1134/S106377882112005X
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DOI: https://doi.org/10.1134/S106377882112005X