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Indices of Faces Developing on Czochralski-Grown Paratellurite Crystals

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Abstract

The known data on the morphology of paratellurite single crystals grown from melt by the Czochralski method are analyzed. The structure of faces is studied by scanning electron microscopy and interference profilometry, and their inclination angles to the pulling axis are measured. Based on calculations, the found faces are indexed as {113}.

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Correspondence to I. A. Kaplunov.

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Translated by Yu. Sin’kov

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Kolesnikov, A.I., Kaplunov, I.A., Sokolova, E.I. et al. Indices of Faces Developing on Czochralski-Grown Paratellurite Crystals. Crystallogr. Rep. 64, 168–173 (2019). https://doi.org/10.1134/S1063774519010115

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  • DOI: https://doi.org/10.1134/S1063774519010115

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