Abstract
Using mathematical design of experiments we studied the spectral composition of an X-ray background in the wavelength region 0.3–1.2 nm in the X-ray fluorescence analysis (XRF) of samples with matrices composed of elements with small atomic numbers, viz plant materials. The interpretation of the results allowed us to quantitatively estimate components of X-ray background for spectrometers with wavelength dispersion and to reveal their dependence on the chemical composition of the specimens. Recommendations are formulated for the account of the background in the plant XRF.
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Original Russian Text © E.V. Chuparina, A.N. Smagunova, L.A. Eliseeva, 2015, published in Zhurnal Analiticheskoi Khimii, 2015, Vol. 70, No. 8, pp. 828–834.
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Chuparina, E.V., Smagunova, A.N. & Eliseeva, L.A. Study of the processes of background formation in the long-wavelength region of X-Ray spectrum. J Anal Chem 70, 949–955 (2015). https://doi.org/10.1134/S1061934815080055
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DOI: https://doi.org/10.1134/S1061934815080055