Abstract
A special technique is proposed for processing detected signals. The technique uses an adjustable orthonormal basis and makes it possible to effectively identify defects by monitoring the structure and peculiarities of surface wave fields.
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Original Russian Text © O.V. Bocharova, A.V. Sedov, I.E. Andzhikovich, V.V. Kalinchuk, 2016, published in Defektoskopiya, 2016, No. 7, pp. 21–28.
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Bocharova, O.V., Sedov, A.V., Andzhikovich, I.E. et al. On a defect identification method based on monitoring the structure and peculiarities of surface wave fields. Russ J Nondestruct Test 52, 377–382 (2016). https://doi.org/10.1134/S1061830916070020
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DOI: https://doi.org/10.1134/S1061830916070020