Abstract
The adsorption of Cd and Te on the surface of a CdTe crystal is studied in situ using a mass spectrometer in the temperature range of 500−700 K and at an incident flux intensity of VCd = 10–2−2 single layers per second, SL/s, and VTe = 0.5−5 SL/s. Computer programs for controlling the experiment and processing the obtained information are developed. The growth parameters are in good agreement with the proposed model of adsorption. The activation energies of the “evaporation” (transition of atoms from the crystal to the adsorption layer) and desorption of Cd atoms and Te2 molecules are 2 and 0.5 eV and 0.59 eV, respectively. It is established that the dependence of the growth rate on the Te2 flux at a constant Cd flux is linear over a wide range, while the dependence of the growth rate on the Cd flux at a constant Te2 flux is nonlinear and reaches saturation. The growth parameters depend on the structural features of the crystal surface (roughness, polycrystallinity, and mosaicity) accompanying film growth at large deviations from equilibrium.
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This work was carried out within the framework of the State Contract for the Crystallography and Photonics Federal Research Center, Russian Academy of Sciences, and according to the program of fundamental research of the Presidium of the Russian Academy of Sciences. Equipment of the common use center of the Crystallography and Photonics Federal Research Center was used in this study with support of the Ministry of Education and Science of the Russian Federation (project RFMEFI62119X0035).
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Mikhaylov, V.I., Polyak, L.E. Mass-Spectrometry Investigation of the Kinetics of the Molecular-Beam Epitaxy of CdTe. J. Surf. Investig. 15, 683–695 (2021). https://doi.org/10.1134/S1027451021040133
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DOI: https://doi.org/10.1134/S1027451021040133