Abstract
The specific features of numerical calculation of the magnetization-reversal process in thin-film components with large linear dimensions and a complex topology in relation to magnetoresistive transducers (sensors) are considered. The calculated value of the sensor sensitivity obtained within the framework of a uniform and micromagnetic magnetization-reversal model is compared with experimental data. Calculations of the magnetization-reversal process within the framework of the micromagnetic model show the positive effect of edge magnetization pinning which is manifested in the mutual compensation of current and magnetization- distribution nonuniformities; it can be used to enhance the sensitivity of anisotropic magnetoresistive (AMR) sensors.
Similar content being viewed by others
References
S. Sheng-Xian, W. Dan, Zh. Yang, et al., Chin. Phys. Lett. 26, 127503 (2009).
R. Zhu, “Accelerate Micromagnetic Simulations with GPU Programming in MATLAB,” arXivpreprintarXiv: 1501.07293 (2015).
S. Tumanski, Thin Film Magnetoresistive Sensors (CRC Press, 2001).
J. A. Osborn, Phys. Rev. 67 (11–12), 351 (1945).
J. Miltat, G. Albuquerque, and A. Thiaville, in Spin Dynamics in Confined Magnetic Structures I (Springer, Berlin, Heidelberg, 2002), p. 1.
The Object Oriented MicroMagnetic Framework (OOMMF) project at ITL/NIST, http://math.nist.gov/oommf/.
Comsol, http://www.comsol.com/.
Author information
Authors and Affiliations
Corresponding author
Additional information
Original Russian Text © N.A. Djuzhev, A.S. Yurov, R.Yu. Preobrazhensky, N.S. Mazurkin, M.Yu. Chinenkov, 2016, published in Poverkhnost’. Rentgenovskie, Sinkhrotronnye i Neitronnye Issledovaniya, 2016, No. 3, pp. 46–50.
Rights and permissions
About this article
Cite this article
Djuzhev, N.A., Yurov, A.S., Preobrazhensky, R.Y. et al. Influence of the magnetization-distribution nonuniformity on the sensitivity of anisotropic magnetoresistive sensors. J. Surf. Investig. 10, 307–311 (2016). https://doi.org/10.1134/S1027451016020051
Received:
Published:
Issue Date:
DOI: https://doi.org/10.1134/S1027451016020051