Abstract
In this paper, a model of the influence of electromigration induced by current flow on the development of instability of the free surface of a conducting film on a substrate is developed. The dependence of the conditions for the appearance of the instability on the value and the direction of the electric field applied to the film and on the value and character of mechanical stress on the boundary with the substrate is obtained and studied analytically.
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Original Russian Text © R.V. Goldstein, T.M. Makhviladze, M.E. Sarychev, 2015, published in Poverkhnost’. Rentgenovskie, Sinkhrotronnye i Neitronnye Issledovaniya, 2015, No. 1, pp. 74–81.
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Goldstein, R.V., Makhviladze, T.M. & Sarychev, M.E. Influence of electrical current on the stability of a conducting film surface. J. Surf. Investig. 9, 67–74 (2015). https://doi.org/10.1134/S1027451015010097
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DOI: https://doi.org/10.1134/S1027451015010097