Skip to main content
Log in

Determination of impurities in bismuth oxide by laser mass spectrometry

  • Published:
Inorganic Materials Aims and scope

Abstract

We have developed a technique for the quantitative analysis of bismuth oxide by laser mass spectrometry. The technique makes it possible to determine up to 70 impurities in the range 10−6 to 10−4 wt %. To evaluate relative sensitivity factors and obtain calibration plots, we used reference samples prepared by diluting a standard SOG-21-1 graphite sample with high-purity bismuth oxide powder.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  1. Nath, A.K. and Medhi, N., Piezoelectric properties of environmental friendly bismuth doped barium titanate ceramics, Mater. Lett., 2012, vol. 73, pp. 75–77.

    Article  CAS  Google Scholar 

  2. Watanabe, T., et al., Hardness and elastic properties of Bi2O3-based glasses, J. Mater. Sci., 2001, vol. 36, pp. 2427–2433.

    Article  CAS  Google Scholar 

  3. Novoselov, I.I., Makarov, I.V., Fedotov, V.A., Ivannikova, N.V., and Shubin, Yu.V., Synthesis of a bismuth germanium oxide source material for Bi4Ge3O12 crystal growth, Inorg. Mater., 2013, vol. 49, no. 4, pp. 412–415.

    Article  CAS  Google Scholar 

  4. Yukhin, Yu.M., Mikhailov, Yu.I., Afonina, L.I., and Podkopaev, O.I., Synthesis of high-purity bismuth oxide, Vysokochist. Veshchestva, 1996, no. 4, pp. 62–71.

    Google Scholar 

  5. Novoselov, I.I., Petrova, N.I., Troitskii, D.Yu., and Tkachev, D.S., Bismuth refining by vacuum distillation, Khim. Khim. Tekhnol., 2006, no. 8, pp. 40–44.

    Google Scholar 

  6. Shelpakova, I.R., Chanysheva, T.A., Tsygankova, A.R., Rodionov, S.G., Troitskii, D.Yu., Petrova, N.I., and Saprykin, A.I., Atomic-emission spectral analysis of bismuth oxide with impurity preconcentration by reactive vaporization of the host, Zavod. Lab. Diagn. Mater,, 2007, vol. 73, no. 8, pp. 15–20.

    CAS  Google Scholar 

  7. Shelpakova, I.R., Tsygankova, A.R., and Saprykin, A.I., Determination of impurities in bismuth and its compounds (review), Metody Obekty Khim. Anal., 2007, vol. 2, no. 2, pp. 117–129.

    Google Scholar 

  8. Tsygankova, A.R., Makashova, G.V., Shelpakova, I.R., and Saprykin, A.I., Analysis of bismuth oxide by inductively coupled plasma atomic emission spectroscopy, Zavod. Lab., Diagn. Mater., 2013, vol. 79, no. 3, pp. 12–16.

    CAS  Google Scholar 

  9. Chanysheva, T.A. and Shelpakova, I.R., Unified atomic emission analysis of various systems, Anal. Kontrol’, 2008, vol. 6, no. 3, pp. 298–306.

    Google Scholar 

  10. Sysoev, A.A., Mass spectrometric elemental analysis of solid substances in Russia, J. Anal. Chem., 2011, vol. 66, no. 11, pp. 1079–1089.

    Article  CAS  Google Scholar 

  11. Polyakova, E.V., Shuvaeva, O.V., and Saprykin, A.I., Chlorine impurity content of Bi2O3 and GeO2, Inorg. Mater., 2008, vol. 44, no. 9, pp. 986–989.

    Article  CAS  Google Scholar 

  12. Sysoev, V.I., Troitskii, D.Yu., and Saprykin, A.I., Analysis of silicon carbonitride films by laser mass spectrometry, Mass-Spektrometriya, 2013, vol. 10, no. 2, pp. 103–108.

    CAS  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to D. Yu. Troitsky.

Additional information

Original Russian Text © D.Yu. Troitsky, A.I. Saprykin, 2015, published in Neorganicheskie Materialy, 2015, Vol. 51, No. 7, pp. 709–713.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Troitsky, D.Y., Saprykin, A.I. Determination of impurities in bismuth oxide by laser mass spectrometry. Inorg Mater 51, 645–649 (2015). https://doi.org/10.1134/S0020168515060175

Download citation

  • Received:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1134/S0020168515060175

Keywords

Navigation