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A Study on the Accelerated Degradation Test of VCTF Cable According to the Calculation Method of Activation Energy

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Abstract

This study analyzed the characteristics of insulation resistance according to activation energy, which is an important index in accelerated degradation testing for the lifetime assessment of cables. The experimental sample used an indoor low-voltage VCTF cable, and the activation energy was calculated using analysis (TGA) and the rate factor. The TGA method measured the mass loss rate of the cable insulator at heating rates of 1 K, 2 K, 5 K, and 10 K and calculated the activation energy of 1 eV. The method using the rate constant analyzed the temperature–time degradation properties of the cable insulation, calculating activation energy of 0.89 eV. Therefore, the accelerated degradation time of the cable was derived from the calculated activation energy, and the degradation test of the cable was performed using a forced convection oven. Furthermore, the insulation resistance of cables with accelerated degradation was measured using a Megger insulation tester. For cables with an equivalent life of less than 20 years, insulation resistance decreased as the equivalent life increased. However, when the activation energy was 0.89 eV, cables with an equivalent life of 30 years had increased insulation resistance compared with those with less degradation time. Accordingly, surface analysis and plasticizer content analysis of the cables manufactured through an accelerated degradation test confirmed that the timing of the increase in insulation resistance and the time of loss of plasticizers were the same. This study, it is confirmed that the insulation resistance of cables was affected by temperature and plasticizer content. Thus, plasticizer content analysis should be considered during the accelerated degradation testing of cables.

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Acknowledgements

This research was supported by the Daejeon University Grants (2021).

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  1. Dept. of Fire & Disaster Prevention Engineering, Daejeon University, Daejeon, Korea

    Sin-Dong Kang & Jae-Ho Kim

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  1. Sin-Dong Kang
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Kang, SD., Kim, JH. A Study on the Accelerated Degradation Test of VCTF Cable According to the Calculation Method of Activation Energy. J. Electr. Eng. Technol. 17, 3067–3075 (2022). https://doi.org/10.1007/s42835-022-01055-w

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  • DOI: https://doi.org/10.1007/s42835-022-01055-w

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