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A rapid detached leaf assay for the phenotyping of spot blotch of wheat

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Abstract

Plant disease resistance (PDR) is an imperative element for the effective and timely management of foliar blights in cereals crops. Because of variations in disease pressure and staggered flowering of wheat germplam material, it is hard to identify cultivars with stable resistance to spot blotch disease caused by Bipolaris sorokiniana across seasons and locations. To overcome these problems, current study was conducted to optimise and validate a rapid and reliable detached leaf assay (DLA) as a phenotyping method to screen wheat genotypes against spot blotch disease. Fifteen wheat genotypes were evaluated based on partial disease resistance (PDR) components: Incubation Period (IP) and Latent Period (LP), to study whether DLA could be comparable to field and greenhouse screening against spot blotch of wheat. The time taken by DLA to successfully screen the genotypes was very less (30 days) as compared to field (80 days) and greenhouse (41 days) experiments. Disease severity obtained in DLA was positively correlated with greenhouse (r = 0.97, P = 0.02) and field experiments (r = 0.94, P = 0.01). Assessments of the host genotypes indicated that the genotype DBW 39 exhibited resistance, while susceptible reaction to the disease was observed in genotype K 1317 and PBW 703. A negative correlation was observed between IP and LP with the disease severity. So, it can be concluded that DLA could be considered as an alternative and reliable way of phenotyping against spot blotch of wheat.

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Data availability

The data that support the findings of this study are available upon request from the corresponding authors.

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Authors and Affiliations

  1. Department of Plant Pathology, Bidhan Chandra Krishi Viswavidyalaya (BCKV), Mohanpur, Nadia, 741252, India

    Sunita Mahapatra, Sunanda Chakraborty & Ranajit Kundu

  2. ICAR-Indian Institute of Wheat and Barley Research, Karnal, Haryana, 132001, India

    Prem Lal Kashyap

Authors
  1. Sunita Mahapatra
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  2. Sunanda Chakraborty
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  3. Ranajit Kundu
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  4. Prem Lal Kashyap
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Correspondence to Sunita Mahapatra or Prem Lal Kashyap.

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Mahapatra, S., Chakraborty, S., Kundu, R. et al. A rapid detached leaf assay for the phenotyping of spot blotch of wheat. Vegetos (2023). https://doi.org/10.1007/s42535-023-00709-y

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