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A Minimum Distance Lack-of-Fit Test in a Markovian Multiplicative Error Model

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Abstract

This paper proposes a lack-of-fit test for a parametric specification of the conditional mean function in a Markovian multiplicative error time series model. The proposed test is based on a minimized distance obtained using an integral of the square of a certain marked residual process. The asymptotic null distribution of the proposed test is model dependent and is not free from the underlying nuisance parameters. We propose a bootstrap method to implement the test and establish that the proposed bootstrap method is asymptotically valid. A finite sample simulation study that evaluates the empirical level and power is included. It compares the finite sample performance of the proposed test with several competing tests from the literature.

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Correspondence to Hira L. Koul.

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This article is part of the topical collection “Celebrating the Centenary of Professor C. R. Rao” guest edited by , Ravi Khattree, Sreenivasa Rao Jammalamadaka, and M. B. Rao.

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Koul, H.L., Perera, I. A Minimum Distance Lack-of-Fit Test in a Markovian Multiplicative Error Model. J Stat Theory Pract 15, 34 (2021). https://doi.org/10.1007/s42519-021-00168-1

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