Abstract
In detached leaf inoculation assay involving root and foliar soluble Si applications, latent period (LP) was measured on eight bread and durum wheat and barley cultivars of contrasting susceptibility to Fusarium head blight (FHB) disease. At the early development stage, differences in LP were observed on wheat and barley detached leaves of Si-Fusarium-inoculated treatments in comparison to fungal-inoculated-controls, showed the beneficial role played by this element in decreasing head blight disease symptoms on young plant parts under in vitro conditions. Si root and foliar treatments involved in the detached leaf inoculation assay enhanced wheat and barley resistance to FHB. For the first time, in vitro evidence of Si absorption and transport was shown in wheat and barley detached leaves infected with diverse Fusarium spp, indicating that Si transporters theoretically localize in the roots and leaves and their expression rates were similar in the roots in comparison to the leaves.
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Sakr, N., Mohamad, F. Silicon affects latent period in wheat and barley leaves infected with diverse Fusaria. Indian Phytopathology 76, 993–1000 (2023). https://doi.org/10.1007/s42360-023-00659-0
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DOI: https://doi.org/10.1007/s42360-023-00659-0