Skip to main content
SpringerLink
Log in

Synergistic effects of total ionizing dose and radiated electromagnetic interference on analog-to-digital converter

  • Published:
Nuclear Science and Techniques Aims and scope Submit manuscript

Abstract

The influence of combined total ionization dose (TID) and radiated electromagnetic interference (EMI) in a commercial analog-to-digital converter (ADC) was studied. The degradation of the direct-current response, the static parameters, and the dynamic parameters caused by the TID and EMI separately and synergistically is presented. The experimental results demonstrate that the increase in TID intensifies data error and the signal-to-noise ratio (SNR) degradation caused by radiated EMI. The cumulative distribution function of EMI failure with respect to data error and SNR with different TIDs was extracted. The decreasing trend of the threshold was acquired with a small sample size of five for each TID group. The result indicates that the ADC is more sensitive in a compound radiation environment.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Fig. 1
Fig. 2

source and ADC devices ready for radiation test

Fig. 3
Fig. 4
Fig. 5
Fig. 6
Fig. 7
Fig. 8
Fig. 9
Fig. 10
Fig. 11
Fig. 12

Similar content being viewed by others

References

  1. Z. Xu, C. Meng, Y. Jiang et al., 3-D simulation of cavity sgemp interference generated by pulsed X-rays. IEEE Trans. Nucl. Sci. 67, 425–433 (2020). https://doi.org/10.1109/TNS.2020.2963983

    Article  ADS  Google Scholar 

  2. F. Consoli, R.D. Angelis, P. Andreoli et al., Experiments on Electromagnetic Pulse (EMP) generated by laser-plasma interaction in nanosecond regime. in Proceedings IEEE 15th International Conference on Environment and Electrical Engineering (EEEIC). IEEE 182–187 (2015). https://doi.org/10.1109/EEEIC.2015.7165537.

  3. P. Sprangle, J.R. Penano, B. Hafizi et al., Ultrashort laser pulses and electromagnetic pulse generation in air and on dielectric surfaces. Phys. Rev. E 69(6), 066415 (2004). https://doi.org/10.1103/PhysRevE.69.066415

    Article  ADS  Google Scholar 

  4. P. Hu, Z. Ma, K. Zhao et al., Development of gated fiber detectors for laser-induced strong electromagnetic pulse environments. Nucl. Sci. Tech. 32(6), 58 (2021). https://doi.org/10.1007/s41365-021-00898-8

    Article  Google Scholar 

  5. W. Liang, K. Alexandrou, M. Klebanov et al., Characterization of ESD protection devices under total ionizing dose irradiation. in IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Jul. 2017, pp. 1–4. doi: https://doi.org/10.1109/IPFA.2017.8060225.

  6. A. Doridant, J. Raoult, A. Blain et al., Electromagnetic susceptibility of low frequency bipolar transistors subject to the total ionizing dose effect. in Proceedings 8th Workshop on Electromagnetic Compatibility of Integrated Circuits, Dubrovnik, Croatia, pp. 105–110 (2011).

  7. J.R. Marbach, R.T. Meoz-Mendez, J.K. Huffman et al., The effects on cardiac pacemakers of ionizing radiation and electromagnetic interference from radiotherapy machines. Int. J. Radiat. Oncology Biol. Phys. 4, 1055–1058 (1978)

    Article  Google Scholar 

  8. C.A. Katzemberg, F.I. Marcus, R.S. Heusinkveld et al., Pacemaker failure due to radiation therapy. Pacing Clin. Electrophysiol. 5, 156–159 (1982). https://doi.org/10.1111/j.1540-8159.1982.tb02207.x

    Article  Google Scholar 

  9. N.A. Estep, J.C. Petrosky, J.W. McClory et al., Electromagnetic interference and ionizing radiation effects on CMOS devices. IEEE Trans. Plasma Sci. 40, 1495–1501 (2012). https://doi.org/10.1109/TPS.2012.2193600

    Article  ADS  Google Scholar 

  10. O.M. Lawal, S. Liu, Z. Li et al., 60Co gamma radiation total ionizing dose combined with conducted electromagnetic interference studies in BJTs. Microelectron. Rel. 82, 159–164 (2018). https://doi.org/10.1016/j.microrel.2018.01.020

    Article  Google Scholar 

  11. X.-Y. Zhang, Q. Guo, Y.-D. Li et al., Total ionizing dose and synergistic effects of magnetoresistive random access memory. Nucl. Sci. Tech. 29(8), 111(2018). https://doi.org/10.1007/s41365-018-0451-8

  12. R. Goerl, P. Villab, F.L. Vargas et al., Combined ionizing radiation & electromagnetic interference test procedure to achieve reliable integrated circuits. Microelectron. Rel. 100–101, 113341 (2019). https://doi.org/10.1016/j.microrel.2019.06.033

    Article  Google Scholar 

  13. J. Benfica, B. Green, B.C. Porcher et al., Analysis of SRAM-based FPGA SEU sensitivity to combined EMI and TID-imprinted effects. IEEE Trans. Nucl. Sci. 63, 1294–1300 (2016). https://doi.org/10.1109/TNS.2016.2523458

    Article  ADS  Google Scholar 

  14. J. Benfica L.M. Bolzani Poehls, F. Vargas et al., Evaluating the effects of combined total ionizing dose radiation and electromagnetic interference. IEEE Trans. Nucl. Sci. 59, 1015–1019 (2012). https://doi.org/10.1109/TNS.2012.2190621.

  15. C.I. Lee, B.G. Rax, A.H. Johnston et al., Total ionizing dose effects on high resolution (12-/14-bit) analog-to-digital converters. IEEE Trans. Nucl. Sci. 41, 2459–2466 (1994). https://doi.org/10.1109/23.340602

    Article  ADS  Google Scholar 

  16. A. Rivetti, G. Anelli, F. Anghinolfi et al., A low-power 10-bit ADC in a 0.25-/spl mu/m CMOS: design considerations and test results. IEEE Trans. Nucl. Sci. 48, 1225–1228 (2001). https://doi.org/10.1109/23.958755.

  17. T.H. Kim, H.C. Lee, Total ionizing dose effects on a 12-bit 40kS/s SAR ADC designed with a dummy gate-assisted n-MOSFET. IEEE Trans. Nucl. Sci. 64, 648–653 (2017). https://doi.org/10.1109/TNS.2016.2631723

    Article  ADS  Google Scholar 

  18. B. Bae, J.J. Kim, S. Kim et al., Noise coupling effects on CMOS analog-to-digital converter in magnetic field wireless power transfer system using chip-PCB comodeling and simulation. IEEE Trans. Electromagn. Compat. 57, 329–338 (2015). https://doi.org/10.1109/TEMC.2015.2402687

    Article  Google Scholar 

  19. T. Aurand, J.F. Dawson, M.P. Robinson et al., Applying IEC 62132–2 to the real world: Immunity of an analogue to digital converter. in Proceedings 2008 International Symposium on Electromagnetic Compatibility-EMC Europe, Hamburg, 2008, pp. 1–4, https://doi.org/10.1109/EMCEUROPE.2008.4786880.

  20. M. Quilez, O. Casas, R. Pallas-Areny et al., Susceptibility of Dual-Slope ADCs to Electromagnetic Interference: An Experimental Analysis. in Proceedings IEEE IMTC, Warsaw, Poland, May 2007, pp. 1–4

  21. F. Wan, F. Duval, X. Savatier et al., Effects of conducted electromagnetic interference on analogue-to-digital converter. Electron. Lett. 47, 23–25 (2011)

    Article  ADS  Google Scholar 

  22. Datasheet MCP3002 - 2.7V Dual Channel 10-Bit A/D Converter with SPI™ Serial Interface. Microchip Technology Inc. 2007. https://www.microchip.com/en-us/product/MCP3002

  23. Integrated Circuits – Measurement of Electromagnetic Immunity-Part 2: Measurement Of Radiated Immunity – TEM Cell And Wideband TEM Cell Method. IEC 62132-2 (2010).

  24. Test Method Standard Microcircuits- Method 1019.8: Ionizing Radiation (Total Dose) Test Procedure DEPARTMENT OF DEFENSE, mil-std-883h (2010).

  25. K. H. Lundberg, Analog-to-Digital Converter Testing. Mass. Inst. Tech. Cambridge, MA, USA. (2002). https://www.mit.edu/~klund/A2Dtesting.pdf

  26. H. Jin, C. Meng, Y. Jiang et al., Simulation of electromagnetic pulses generated by escaped electrons in a high-power laser chamber. Plasma Sci. Technol. 20, 115201 (2018). https://doi.org/10.1088/2058-6272

    Article  ADS  Google Scholar 

  27. B. Sürücü, H. Sazak, Monitoring reliability for a three-parameter Weibull distribution. Rel. Eng. Syst. Saf. 94, 503–508 (2009)

    Article  Google Scholar 

  28. M. Sirvanci, G. Yang, Estimation of the Weibull parameters under type I censoring. J. Amer. Stats. Assoc. 79, 183–187 (1984)

    Article  MathSciNet  Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Department of Engineering Physics, Tsinghua University, Beijing, 100084, China

    Ping Wu, Zhi-Qian Xu, Yun-Sheng Jiang & Cui Meng

  2. Laboratory of Particle and Radiation Imaging, Ministry of Education, Beijing, 100084, China

    Ping Wu, Zhi-Qian Xu, Yun-Sheng Jiang & Cui Meng

  3. Xinjiang Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Urumqi, 830011, China

    Lin Wen & Qi Guo

  4. Key Laboratory of Functional Materials and Devices for Special Environments, Urumqi, 830011, China

    Lin Wen & Qi Guo

Authors
  1. Ping Wu
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Lin Wen
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. Zhi-Qian Xu
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. Yun-Sheng Jiang
    View author publications

    You can also search for this author in PubMed Google Scholar

  5. Qi Guo
    View author publications

    You can also search for this author in PubMed Google Scholar

  6. Cui Meng
    View author publications

    You can also search for this author in PubMed Google Scholar

Contributions

All authors contributed to the study conception and design. Material preparation, experiment operation and data collection were performed by Ping Wu, Lin Wen and Zhi-Qian Xu. Data analysis was performed by Ping Wu. The first draft of the manuscript was written by Ping Wu, and all authors commented on previous versions of the manuscript. All authors read and approved the final manuscript.

Corresponding author

Correspondence to Cui Meng.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Wu, P., Wen, L., Xu, ZQ. et al. Synergistic effects of total ionizing dose and radiated electromagnetic interference on analog-to-digital converter. NUCL SCI TECH 33, 39 (2022). https://doi.org/10.1007/s41365-022-01017-x

Download citation

  • Received:

  • Revised:

  • Accepted:

  • Published:

  • DOI: https://doi.org/10.1007/s41365-022-01017-x

Keywords

Search

Navigation